Inventor
Taisuke Hirono
Inventor
Chofu, JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties38%
B01LChemical or physical laboratory apparatus for general use23%
A61BDiagnosis15%
B01FMixing, e.g. dissolving, emulsifying or dispersing8%
G01BMeasuring length, thickness or similar linear dimensions8%
Y10TTechnical subjects covered by former us classification8%
PatentTitleYear
8,740,384'Method and apparatus for measuring molecular composition'20148,218,132'Particle measuring device and particle size measure device'20127,553,454'Micro chip device'20097,295,306'Microchip and fluorescent particle counter with microchip'20076,719,203'Cuvette control unit and controlling method using the same'20046,198,540'Optical coherence tomography have plural reference beams of differing modulations'20015,610,672'Ophthalmic measurement apparatus for measuring biological properties in the eye'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2014Patents assigned to KOWA CO (6)· patent assignee history
1997–2009Based in Chofu, JP· patent location history
2004Based in Ibaraki, JP· patent location history
2007Based in Shizuoka, JP· patent location history
2009–2012Patents assigned to UNIV ELECTRO COMMUNICATIONS (2)· patent assignee history
2012–2014Patents assigned to HIRONO TAISUKE (2)· patent assignee history
2012Patents assigned to OKAWA SHINPEI (1)· patent assignee history
2012Patents assigned to YAMADA YUKIO (1)· patent assignee history
2012Based in Tokyo, JP· patent location history
2014Based in Hamamatsu, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KOWA CO | 6 | 1997–2014 |
| HIRONO TAISUKEself | 2 | 2012–2014 |
| UNIV ELECTRO COMMUNICATIONS | 2 | 2009–2012 |
| OKAWA SHINPEI | 1 | 2012 |
| YAMADA YUKIO | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Chofu, JP | 3 | 1997–2009 |
| Hamamatsu, JP | 1 | 2014 |
| Tokyo, JP | 1 | 2012 |
| Shizuoka, JP | 1 | 2007 |
| Ibaraki, JP | 1 | 2004 |