Inventor
Thomas Von Der Haar
Inventor
Nuremberg, DE
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Tprimary
G01TMeasurement of nuclear or x-radiation30%
A61BDiagnosis24%
G01NInvestigating or analysing materials by determining their chemical or physical properties18%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation9%
G06TImage data processing or generation, in general6%
H05GX-ray technique6%
G21KHandling of particles or ionising radiation not otherwise provided for3%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
PatentTitleYear
8,915,647'Method for correcting detector data of an X-ray detector and X-ray recording system'20148,064,568'Method and device to generate projections of the inside of an examination subject'20117,361,902'Radiation detector with a detection field comprising scintillators and photodiodes'20087,314,311'Method for testing the quality of a detector module for an x-ray computer tomograph'20087,235,788'Detector for a tomography unit'20077,193,217'X-ray detector'20077,180,075'X-ray detector including a scintillator with a photosensor coating, and a production process'20077,148,486'Image detector for x-ray devices with rear-contact organic image sensors'20067,139,362'Computer tomograph comprising energy discriminating detectors'20067,109,490'Method and medical device designed for implementing this method'20067,081,627'Image detector for X-ray radiation'20066,870,898'Computed tomography apparatus with automatic parameter modification to prevent impermissible operating states'20056,845,141'Computed tomography apparatus wherein an image of a subject is reconstructed for a reconstruction field that is larger than the measuring field'20056,823,038'X-ray detector array and method for manufacturing same'20046,667,482'Radiation detector for a computed tomography'20036,535,571'Detector for an X-ray computed tomography apparatus'20036,411,671'Method for reducing line artifacts in a CT image and device for implementing the method'20026,400,793'Detector for an X-ray computed tomography apparatus'20026,320,929'Method for scanning an examination subject with a CT device'20016,137,859'Method for manufacturing detector system for a computed tomography apparatus'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2014Patents assigned to SIEMENS AG (20)· patent assignee history
2000Based in Erlangen, DE· patent location history
2001–2011Based in Nuremberg, DE· patent location history
2002Based in Nrnberg, DE· patent location history
2003–2007Based in Nuernberg, DE· patent location history
2005–2014Based in Nürnberg, DE· patent location history
2011–2014Patents assigned to VON DER HAAR THOMAS (2)· patent assignee history
2014Patents assigned to KAPPLER STEFFEN (1)· patent assignee history
2014Patents assigned to KIPPES JOHANNES (1)· patent assignee history
2014Patents assigned to KRAFT EDGAR (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SIEMENS AG | 20 | 2000–2014 |
| VON DER HAAR THOMASself | 2 | 2011–2014 |
| KAPPLER STEFFEN | 1 | 2014 |
| KIPPES JOHANNES | 1 | 2014 |
| KRAFT EDGAR | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nuremberg, DE | 9 | 2001–2011 |
| Nürnberg, DE | 6 | 2005–2014 |
| Nuernberg, DE | 3 | 2003–2007 |
| Nrnberg, DE | 1 | 2002 |
| Erlangen, DE | 1 | 2000 |