Inventor
Satoru Tachihara
Inventor
Tokyo, JP
Overview
Patents· 36 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus44%
H04NPictorial communication, e.g. television16%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices6%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation6%
B24BMachines, devices, or processes for grinding or polishing5%
G06FElectric digital data processing5%
H01LSemiconductor devices5%
G11BInformation storage based on relative movement between record carrier and transducer3%
B26FPerforating2%
B29DProducing particular articles from plastics or from substances in a plastic state2%
PatentTitleYear
10,002,215Arrayed imaging systems having improved alignment and associated methods20189,876,051Miniature wafer-level camera modules20189,418,193'Arrayed imaging systems having improved alignment and associated methods'20168,736,699'Multi-region imaging systems'20148,599,301'Arrayed imaging systems having improved alignment and associated methods'20137,710,658'Zoom lens systems with wavefront coding'20106,396,627'Stereoscopic microscope including zoom and relay optical systems'20026,384,968'Microscope with illuminating optical system'20025,914,822'Chromatic aberration correcting element and its application'19995,825,555'Beam projecting apparatus'19985,798,851'Apparatus for correcting scanning position in optical scanner'19985,781,350'Objective lens for endoscope'19985,724,190'Objective lens for endoscope'19985,664,251'Method of making an aperture plate for a multibeam pattern drawing apparatus'19975,651,598'Projector'19975,629,799'Chromatic aberration correcting element and its application'19975,579,174'Objective lens for endoscope'19965,530,591'Objective lens for endoscope'19965,305,029'Projector'19945,168,306'Exposure apparatus'19925,117,106'Scanning pattern drawing apparatus'19925,093,561'Drawing surface adjusting mechanism for scanning pattern drawing apparatus'19925,046,796'Apparatus for correcting scanning beams on basis of tilting of surface segments of polygonal mirror used in scanning pattern drawing apparatus'19915,043,566'Monitor mechanism for use with a scanning optical apparatus with composite drawing a monitoring beams'19915,027,137'Drawing surface adjusting mechanism for use with scanning pattern drawing apparatus'19915,017,949'Table assembly for pattern drawing apparatus'19914,735,493'Wipe-angle zoom lens system'19884,726,667'Focusing method in optical lens system with variable focal length'19884,550,987'Small size telephoto lens'19854,412,725'Rear stop diaphragm zoom lens'19834,384,770'Focus detecting device'19834,345,821'Zoom lens'19824,345,822'Telephoto zoom lens'19824,258,989'Focus detecting device'19814,240,700'Wide angle zoom lens having a high variation ratio'19804,185,893'Zoom lenses'1980Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1980–2002Patents assigned to ASAHI OPTICAL CO LTD (28)· patent assignee history
1980–2002Patents assigned to ASAHI KOGAKU KK (2)· patent assignee history
1980–1983Based in Wako, JP· patent location history
1980–2002Based in Saitama, JP· patent location history
1983–1999Based in Tokyo, JP· patent location history
1992Based in Shiki, JP· patent location history
2010–2018Based in Boulder, CO, US· patent location history
2013–2018Patents assigned to OMNIVISION TECH INC (5)· patent assignee history
2013–2014Patents assigned to DOBBS DENNIS W (2)· patent assignee history
2013–2014Patents assigned to DOWSKI JR EDWARD R (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASAHI OPTICAL CO LTD | 28 | 1980–2002 |
| OMNIVISION TECH INC | 5 | 2013–2018 |
| ASAHI KOGAKU KK | 2 | 1980–2002 |
| DOBBS DENNIS W | 2 | 2013–2014 |
| DOWSKI JR EDWARD R | 2 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 21 | 1983–1999 |
| Boulder, CO, US | 6 | 2010–2018 |
| Wako, JP | 5 | 1980–1983 |
| Saitama, JP | 3 | 1980–2002 |
| Shiki, JP | 1 | 1992 |