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Inventor

Shinji Akaike

Inventor
Kofu, JP

Overview

6→
Patents
1996–2019
Patent span
Physics
Primary field (CPC G)

Patents· 6 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables63%
G01BMeasuring length, thickness or similar linear dimensions13%
G06TImage data processing or generation, in general13%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
PatentTitleYear
10,310,010Probe apparatus and probe method201910,074,192Substrate inspection apparatus and control method thereof201810,006,941Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit20185,777,485'Probe method and apparatus with improved probe contact'19985,640,101'Probe system and probe method'19975,585,738'Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment'1996

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1996–2019Patents assigned to TOKYO ELECTRON LTD (6)· patent assignee history
1996–1997Patents assigned to TEL YAMANISHI KK (2)· patent assignee history
1996–1998Based in Kofu, JP· patent location history
2018Based in Nirasaki, JP· patent location history
2019Patents assigned to SEIWA OPTICAL CO LTD (1)· patent assignee history
2019Based in Yamanashi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOKYO ELECTRON LTD61996–2019
TEL YAMANISHI KK21996–1997
SEIWA OPTICAL CO LTD12019
Locations
LocationPatentsSpan
Kofu, JP31996–1998
Nirasaki, JP22018
Yamanashi, JP12019