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Inventor

Takashi Niida

Inventor
Shinagawa-ku, JP

Overview

1→
Patents
2004
Patent span
Physics
Primary field (CPC G)

Patents· 1 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties100%
PatentTitleYear
6,726,739'Method of treating metal analysis sample and device thereof'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004Patents assigned to ABIKO KENJI (1)· patent assignee history
2004Patents assigned to JAPAN ANALYST CORP (1)· patent assignee history
2004Patents assigned to JFE STEEL CORP (1)· patent assignee history
2004Patents assigned to ULVAC PHI INC (1)· patent assignee history
2004Based in Shinagawa-ku, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ABIKO KENJI12004
JAPAN ANALYST CORP12004
JFE STEEL CORP12004
ULVAC PHI INC12004
Locations
LocationPatentsSpan
Shinagawa-ku, JP12004