Inventor
Juha Koljonen
Inventor
Needham, MA, US
Overview
Patents· 27 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Tprimary
G06TImage data processing or generation, in general37%
G06VImage or video recognition or understanding19%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
B23KSoldering or unsoldering8%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
H05KPrinted circuits7%
G01RMeasuring electric variables5%
G06KGraphical data reading2%
H04NPictorial communication, e.g. television2%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%
PatentTitleYear
9,147,252'Method for partitioning a pattern into optimized sub-patterns'20158,189,904'Image preprocessing for probe mark inspection'20128,081,820'Method for partitioning a pattern into optimized sub-patterns'20117,885,453'Image preprocessing for probe mark inspection'20117,242,801'Image preprocessing for probe mark inspection'20077,162,073'Methods and apparatuses for detecting classifying and measuring spot defects in an image of an object'20076,983,065'Method for extracting features from an image using oriented filters'20066,801,649'Method and apparatus for determining a reference point of a bottle bottom in an image'20046,768,812'Method for locating features on an object using varied illumination'20046,681,037'Apparatus for locating features of an object using varied illumination'20046,636,298'Method and apparatus for focusing an optical inspection system'20036,574,358'Automatic training of inspection sites for paste inspection'20036,567,542'Automatic training of inspection sites for paste inspection by using sample pads'20036,317,513'Method and apparatus for inspecting solder paste using geometric constraints'20016,249,602'Method and apparatus for determining a reference point of an object profile within an image'20015,991,436'Apparatus and method for inspecting wirebonds on leads'19995,982,927'Methods and apparatuses for in-line solder paste inspection'19995,912,984'Method and apparatus for in-line solder paste inspection'19995,901,241'Labeled projection of digital images'19995,861,909'Apparatus for automated optical inspection objects'19995,835,622'Method and apparatus to locate and measure capillary indentation marks on wire bonded leads'19985,757,956'Template rotating method for locating bond pads in an image'19985,754,679'Image rotating method for locating bond pads in an image'19985,640,199'Automated optical inspection apparatus'19975,581,632'Method and apparatus for ball bond inspection system'19965,550,763'Using cone shaped search models to locate ball bonds on wire bonded devices'19965,532,739'Automated optical inspection apparatus'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2004Patents assigned to COGNEX CORP (16)· patent assignee history
1996–2015Based in Needham, MA, US· patent location history
2003–2012Patents assigned to COGNEX TECH & INVESTMENT CORP (9)· patent assignee history
2004Based in Needbon, MA, US· patent location history
2011–2015Patents assigned to KOLJONEN JUHA (3)· patent assignee history
2011–2015Patents assigned to DAVIS JASON (2)· patent assignee history
2015Patents assigned to COGNEX TECHNOLOGY AND INVEST LLC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| COGNEX CORP | 16 | 1996–2004 |
| COGNEX TECH & INVESTMENT CORP | 9 | 2003–2012 |
| KOLJONEN JUHAself | 3 | 2011–2015 |
| DAVIS JASON | 2 | 2011–2015 |
| COGNEX TECHNOLOGY AND INVEST LLC | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Needham, Massachusetts, US | 26 | 1996–2015 |
| Needbon, Massachusetts, US | 1 | 2004 |