Inventor
David T. Crook
Inventor
Loveland, CO, US
Overview
Patents· 31 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables38%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests9%
G06FElectric digital data processing6%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses6%
F02PIgnition, other than compression ignition, for internal-combustion engines4%
G01DMeasuring not specially adapted for a specific variable4%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
H03FAmplifiers4%
H03KPulse technique4%
H03MCoding4%
PatentTitleYear
10,006,863Adjustment of measurement system components20189,329,054'Adjustment of measurement system components'20167,957,920'Milking machine testing'20117,492,170'Probe based information storage for probes used for opens detection in in-circuit testing'20097,109,728'Probe based information storage for probes used for opens detection in in-circuit testing'20067,026,846'Synthesizer structures and methods that reduce spurious signals'20066,930,494'Capacitive probe assembly with flex circuit'20056,901,336'Method and apparatus for supplying power, and channeling analog measurement and communication signals over single pair of wires'20056,876,214'Method and apparatus for configurable hardware augmented program generation'20056,636,061'Method and apparatus for configurable hardware augmented program generation'20036,621,354'Feedback methods and systems for rapid switching of oscillator frequencies'20036,549,079'Feedback systems for enhanced oscillator switching time'20036,529,019'Multiple axis magnetic test for open integrated circuit pins'20036,522,206'Adaptive feedback-loop controllers and methods for rapid switching of oscillator frequencies'20036,377,901'Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time'20026,324,486'Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time'20015,898,325'Dual tunable direct digital synthesizer with a frequency programmable clock and method of tuning'19995,703,519'Drive circuit and method for controlling the cross point levels of a differential CMOS switch drive signal'19975,696,451'Identification of pin-open faults by capacitive coupling'19975,661,422'High speed saturation prevention for saturable circuit elements'19975,625,292'System for measuring the integrity of an electrical contact'19975,557,209'Identification of pin-open faults by capacitive coupling through the integrated circuit package'19965,530,444'Differential amplifiers which can form a residue amplifier in sub-ranging A/D converters'19965,498,964'Capacitive electrode system for detecting open solder joints in printed circuit assemblies'19965,479,119'High speed active overvoltage detection and protection for overvoltage sensitive circuits'19955,469,064'Electrical assembly testing using robotic positioning of probes'19955,381,417'Circuit testing system'19955,274,336'Capacitively-coupled test probe'19935,254,953'Identification of pin-open faults by capacitive coupling through the integrated circuit package'19934,801,878'In-circuit transistor beta test and method'19894,799,023'Circuits and apparatus which enable elimination of setup time and hold time testing errors'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–1997Patents assigned to HEWLETT PACKARD CO (10)· patent assignee history
1989–2018Based in Loveland, CO, US· patent location history
1995–2006Patents assigned to ANALOG DEVICES INC (9)· patent assignee history
1995–2006Based in Summerfield, NC, US· patent location history
2001–2009Patents assigned to AGILENT TECHNOLOGIES INC (9)· patent assignee history
2011Based in Swansea, GB· patent location history
2016–2018Patents assigned to HACH CO (2)· patent assignee history
2016Patents assigned to CROOK DAVID T (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HEWLETT PACKARD CO | 10 | 1989–1997 |
| AGILENT TECHNOLOGIES INC | 9 | 2001–2009 |
| ANALOG DEVICES INC | 9 | 1995–2006 |
| HACH CO | 2 | 2016–2018 |
| CROOK DAVID Tself | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Loveland, CO, US | 21 | 1989–2018 |
| Summerfield, NC, US | 9 | 1995–2006 |
| Swansea, GB | 1 | 2011 |