Inventor
Alberto Pagani
Inventor
Nova Milanese, IT
Overview
Patents· 124 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables15%
H01LSemiconductor devices15%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1014%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h109%
H10DInorganic electric semiconductor devices6%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure5%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
H01QAntennas, i.e. radio aerials3%
Y10TTechnical subjects covered by former us classification3%
H05KPrinted circuits2%
PatentTitleYear
10,876,999Block made of a building material202010,868,479Inverse electrowetting and magnetic energy harvesting and scavenging methods, circuits and systems202010,861,842Electronic system having increased coupling by using horizontal and vertical communication channels202010,794,783Pressure sensing device with cavity and related methods202010,788,389Pressure sensor with testing device and related methods202010,775,426System and method for electrical testing of through silicon vias (TSVs)202010,746,787Testing architecture of circuits integrated on a wafer202010,746,788Sensing structure of alignment of a probe for testing integrated circuits202010,715,216Network of electronic devices assembled on a flexible support and communication method202010,677,816Electromagnetic shield for testing integrated circuits202010,641,821Crosstalk suppression in wireless testing of semiconductor devices202010,598,578Tensile stress measurement device with attachment plates and related methods202010,557,753Spectrometer apparatus202010,527,512Integrated pressure sensor with double measuring scale, pressure measuring device including the integrated pressure sensor, braking system, and method of measuring a pressure using the integrated pressure sensor202010,497,655Methods, circuits and systems for a package structure having wireless lateral connections201910,457,545Magnetic inertial sensor energy harvesting and scavenging methods, circuits and systems201910,453,833Electronic system having increased coupling by using horizontal and vertical communication channels201910,424,633Integrated circuit comprising at least an integrated antenna201910,393,692Integrated electronic device for monitoring humidity and/or corrosion201910,366,969Integrated electronic device with transceiving antenna and magnetic interconnection201910,364,143Integrated micro-electromechanical device of semiconductor material having a diaphragm, such as a pressure sensor and an actuator201910,355,337Packaged electronic device with integrated electronic circuits having transceiving antennas201910,330,640Block made of a building material201910,319,708Electronic system having increased coupling by using horizontal and vertical communication channels201910,288,682Integrated electronic device having a test architecture, and test method thereof201910,280,070Magnetic inertial sensor energy harvesting and scavenging methods, circuits and systems201910,267,849Sensing structure of alignment of a probe for testing integrated circuits201910,250,301Network of electronic devices assembled on a flexible support and communication method201910,250,163Inverse electrowetting energy harvesting and scavenging methods, circuits and systems201910,215,652Microelectromechanical sensing structure for a pressure sensor including a deformable test structure201910,186,463Method of filling probe indentations in contact pads201910,180,456Testing architecture of circuits integrated on a wafer201910,153,073Integrated circuit (IC) including semiconductor resistor and resistance compensation circuit and related methods201810,132,934Integrated detection device, in particular detector of particles such as particulates or alpha particles201810,107,837Method for producing probes for testing integrated electronic circuits201810,070,992Implantable modular system for a system for electrically stimulating a biological tissue201810,068,961Integrated circuit comprising at least an integrated antenna201810,060,972Probe card for testing integrated circuits201810,062,668Semiconductor electronic device with improved testing features and corresponding packaging method201810,041,848Pressure sensor device for measuring a differential normal pressure to the device and related methods201810,001,453Integrated electronic device for monitoring humidity and/or corrosion20189,966,318System for electrical testing of through silicon vias (TSVs)20189,939,338Pressure sensing device with cavity and related methods20189,929,089'Inductive connection structure for use in an integrated circuit'20189,922,945'Methods, circuits and systems for a package structure having wireless lateral connections'20189,887,165'IC with insulating trench and related methods'20189,881,911'Electronic system having increased coupling by using horizontal and vertical communication channels'20189,880,219'Sensing structure of alignment of a probe for testing integrated circuits'20189,874,598System and method for electrical testing of through silicon vias (TSVs)20189,874,586Electromagnetic shield for testing integrated circuits20189,835,515Pressure sensor with testing device and related methods20179,823,304'Integrated electronic device having a test architecture, and test method thereof'20179,823,300'Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic device'20179,804,047'Integrated pressure sensor with double measuring scale, pressure measuring device including the integrated pressure sensor, braking system, and method of measuring a pressure using the integrated pressure sensor'20179,799,630'Integrated electronic device with transceiving antenna and magnetic interconnection'20179,791,303'Package, made of building material, for a parameter monitoring device, within a solid structure, and relative device'20179,791,498'Crosstalk suppression in wireless testing of semiconductor devices'20179,778,117'Integrated electronic device for monitoring pressure within a solid structure'20179,752,944'Microelectromechanical sensing structure for a pressure sensor including a deformable test structure'20179,726,587'Tensile stress measurement device with attachment plates and related methods'20179,728,837'Method and apparatus for tuning a resonant circuit using a laser'20179,719,874'Pressure sensor device for measuring a differential normal pressure to the device and related methods'20179,704,624'Integrated circuit (IC) including semiconductor resistor and resistance compensation circuit and related methods'20179,698,295'High-frequency optoelectronic detector, system and method'20179,638,715'Testing of electronic devices through capacitive interface'20179,618,532'Magnetic inertial sensor and method for operating the same'20179,606,085'Block made of a building material'20179,607,912'Integrated circuit comprising at least an integrated antenna'20179,541,601'Testing architecture of circuits integrated on a wafer'20179,530,743'Integrated electronic device with transceiving antenna and magnetic interconnection'20169,520,921'Network of electronic devices assembled on a flexible support and communication method'20169,514,879'Signal transmission through LC resonant circuits'20169,478,470'System for electrical testing of through-silicon vias (TSVs), and corresponding manufacturing process'20169,464,952'Integrated electronic device for monitoring mechanical stress within a solid structure'20169,442,159'Testing integrated circuits using few test probes'20169,419,071'Integrated circuit comprising at least an integrated antenna'20169,416,083'Method of isolating ingenol'20169,413,055'Packaged electronic device with integrated electronic circuits having transceiving antennas'20169,322,839'Magnetic inertial sensor and method for operating the same'20169,318,313'Semiconductor structure with low-melting-temperature conductive regions, and method of repairing a semiconductor structure'20169,318,516'High-frequency optoelectronic detector, system and method'20169,275,962'Probe pad with indentation'20169,256,027'Integrated optoelectronic device and system with waveguide and manufacturing process thereof'20169,257,499'Connection structure for an integrated circuit with capacitive function'20169,257,250'Magnetic relay device made using MEMS or NEMS technology'20169,229,031'Probes for testing integrated electronic circuits and corresponding production method'20169,224,694'Traceable integrated circuits and production method thereof'20159,209,385'Magnetic sensor integrated in a chip for detecting magnetic fields perpendicular to the chip and manufacturing process thereof'20159,202,951'Integrated optoelectronic device and system with waveguide and manufacturing process thereof'20159,191,072'RF identification device with near-field-coupled antenna'20159,188,635'Integrated circuit comprising at least an integrated antenna'20159,176,185'Active probe card for electrical wafer sort of integrated circuits'20159,154,188'RF identification device with near-field-coupled antenna'20159,146,273'Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic device'20159,134,367'Sensing structure of alignment of a probe for testing integrated circuits'20159,112,263'Electronic communications device with antenna and electromagnetic shield'20159,111,895'System and method for electrical testing of through silicon vias (TSVs)'20159,097,637'Integrated electronic device for monitoring parameters within a solid structure and monitoring system using such a device'20159,099,453'Methods, circuits and systems for a package structure having wireless lateral connections'20159,076,883'Integrated electronic device with transceiving antenna and magnetic interconnection'20159,008,785'Retinal prosthesis'20159,007,806'Electromechanical integrated memory element and electronic memory comprising the same'20159,000,788'Method for performing an electrical testing of electronic devices'20158,978,483'Integrated electronic device for detecting a local parameter related to a force experienced in a predetermined direction, within a solid structure'20158,976,010'Security system for at least an integrated circuit, secure integrated circuit card, and method of secure wireless communications'20158,967,000'Planar electric board with pliable wings and system for sensing components along three coordinate axis of inner forces in a block made of a building material'20158,941,401'Test circuit of an integrated circuit on a wafer'20158,941,108'Method to perform electrical testing and assembly of electronic devices'20158,928,346'Method for an improved checking of repeatability and reproducibility of a measuring chain for semiconductor device testing'20158,907,693'Electromagnetic shield for testing integrated circuits'20148,902,016'Signal transmission through LC resonant circuits'20148,829,931'Testing method for semiconductor integrated electronic devices and corresponding test architecture'20148,791,711'Testing of electronic devices through capacitive interface'20148,643,395'Crosstalk suppression in wireless testing of semiconductor devices'20148,604,570'Integrated electronic device with transceiving antenna and magnetic interconnection'20138,604,816'Probe card for testing integrated circuits'20138,479,066'Process for making an electric testing of electronic devices'20138,441,272'MEMS probe for probe cards for integrated circuits'20138,378,346'Circuit architecture for the parallel supplying during electric or electromagnetic testing of a plurality of electronic devices integrated on a semiconductor wafer'20138,362,620'Electronic devices with extended metallization layer on a passivation layer'20138,362,796'Testing integrated circuits using few test probes'20138,358,147'Testing integrated circuits'20137,915,908'Crosstalk suppression in wireless testing of semiconductor devices'20114,895,634'Porous separatory member entirely made of polyphenylene sulfide for the electrolysis of water'1990Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1990Based in Milan, IT· patent location history
2011–2020Patents assigned to ST MICROELECTRONICS SRL (121)· patent assignee history
2011–2020Based in Nova Milanese, IT· patent location history
2013–2018Patents assigned to PAGANI ALBERTO (31)· patent assignee history
2013–2015Patents assigned to GIRLANDO GIOVANNI (4)· patent assignee history
2015Patents assigned to FINOCCHIARO ALESSANDRO (4)· patent assignee history
2015Patents assigned to FERLA GIUSEPPE (2)· patent assignee history
2016Based in Cordoba, ES· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ST MICROELECTRONICS SRL | 121 | 2011–2020 |
| PAGANI ALBERTOself | 31 | 2013–2018 |
| FINOCCHIARO ALESSANDRO | 4 | 2015 |
| GIRLANDO GIOVANNI | 4 | 2013–2015 |
| FERLA GIUSEPPE | 2 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nova Milanese, IT | 122 | 2011–2020 |
| Cordoba, ES | 1 | 2016 |
| Milan, IT | 1 | 1990 |