Inventor
Tohru Ishibashi
Inventor
Tokyo, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B41Jprimary
B41JTypewriters12%
H04NPictorial communication, e.g. television12%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms10%
H01LSemiconductor devices10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
B01LChemical or physical laboratory apparatus for general use7%
B08BCleaning in general7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry5%
B82YSpecific uses or applications of nanostructures5%
PatentTitleYear
11,094,548Apparatus for cleaning substrate and substrate cleaning method202111,081,373Substrate cleaning apparatus and substrate cleaning method202110,991,602Substrate washing device202110,892,173Substrate cleaning roll, substrate cleaning apparatus, and substrate cleaning method202110,518,546Liquid discharge apparatus, imprint apparatus and part manufacturing method201910,469,741Image processing apparatus and image processing method201910,384,451Liquid discharge apparatus, imprint apparatus, and method of manufacturing a component201910,245,835Liquid discharging apparatus, imprint apparatus, and method of manufacturing a component201910,205,878Image processing apparatus, image-capturing apparatus, image processing method, and non-transitory computer-readable storage medium20199,834,002Liquid discharge apparatus, imprint apparatus and part manufacturing method20179,493,004'Liquid discharge apparatus and method for controlling the same'20168,773,547'Imaging apparatus for facilitating a focus adjustment check at the time of multiple exposure shooting'20148,659,666'Electronic apparatus'20148,576,304'Imaging apparatus and control method thereof'20138,367,324'Method for judging change in probe-bearing substrate, probe-bearing substrate and detecting apparatus'20138,323,892'Hybridization method and apparatus'20127,917,304'Spotter provided with spot pattern encryption function and detection device coping with spot pattern encryption'20117,219,019'Spotter provided with spot pattern encryption function and detection device coping with spot pattern encryption'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2019Patents assigned to CANON KK (14)· patent assignee history
2007–2021Based in Tokyo, JP· patent location history
2012–2014Patents assigned to ISHIBASHI TOHRU (5)· patent assignee history
2012Patents assigned to NOZATO KOJI (1)· patent assignee history
2014Patents assigned to GYOTOKU TAKASHI (1)· patent assignee history
2016Based in Kawasaki, JP· patent location history
2017–2019Based in Saitama, JP· patent location history
2021Patents assigned to EBARA CORP (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CANON KK | 14 | 2007–2019 |
| ISHIBASHI TOHRUself | 5 | 2012–2014 |
| EBARA CORP | 4 | 2021 |
| GYOTOKU TAKASHI | 1 | 2014 |
| NOZATO KOJI | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 13 | 2007–2021 |
| Saitama, JP | 4 | 2017–2019 |
| Kawasaki, JP | 1 | 2016 |