Inventor
Keith A. Nelson
Inventor
Newton, MA, US
Overview
Patents· 47 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties21%
LOC0616%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein11%
G01BMeasuring length, thickness or similar linear dimensions9%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light9%
H01LSemiconductor devices4%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light4%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation4%
A63BApparatus for physical training, gymnastics, swimming, climbing, or fencing3%
G01RMeasuring electric variables3%
PatentTitleYear
D0899835Letter M chair2020D0889178Letter N chair2020D0878129Letter L chair2020D0868519Letter T chair201910,495,703Systems, apparatus, and methods of nonlinear terahertz (THz) magnetic resonance measurement2019D0854868Letter R chair2019D0846931Letter y chair201910,241,058Systems and methods for quality control of a periodic structure2019D0826612Letter S chair201810,024,723Detection of electromagnetic radiation using nonlinear materials20189,945,914Systems, apparatus, and methods of nonlinear terahertz (THz) magnetic resonance measurement2018D0807092'Letter U chair'20189,829,379Two-dimensional spectroscopy system and two-dimensional spectroscopic analysis method20179,810,578'Systems, methods, and apparatus for radiation detection'2017D0786596'Letter O chair'2017D0765452'Letter I chair'20169,366,576'Detection of electromagnetic radiation using nonlinear materials'2016D0735511'Letter E chair'20159,074,936'Multidimensional pulse shaper and spectrometer'20159,000,376'Detection of electromagnetic radiation using nonlinear materials'2015D0699993'Letter A chair'20147,846,330'Oil filter drain tool'20107,601,977'Phase-matched terahertz emitter'20097,495,816'Diffraction-based pulse shaping with a 2D optical modulator'20097,387,027'Characterization of materials with optically shaped acoustic waveforms'20087,348,569'Acceleration of charged particles using spatially and temporally shaped electromagnetic radiation'20086,795,198'Method and device for measuring thin films and semiconductor substrates using reflection mode geometry'20046,717,717'Dynamic wavelength shifting method'20046,482,138'Rotational friction exercise device selectively attached to a support surface'20026,479,822'System and Method for terahertz frequency measurements'20026,356,349'Polariton wave imaging'20026,349,128'Method and device using x-rays to measure thickness and composition of thin films'20026,348,967'Method and device for measuring the thickness of opaque and transparent films'20026,204,926'Methods and system for optically correlating ultrashort optical waveforms'20016,081,330'Method and device for measuring the thickness of opaque and transparent films'20006,075,640'Signal processing by optically manipulating polaritons'20006,069,703'Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure'20005,999,308'Methods and systems for introducing electromagnetic radiation into photonic crystals'19995,982,482'Determining the presence of defects in thin film structures'19995,812,261'Method and device for measuring the thickness of opaque and transparent films'19985,734,470'Device and method for time-resolved optical measurements'19985,719,650'High-fidelity spatial light modulator'19985,682,262'Method and device for generating spatially and temporally shaped optical waveforms'19975,672,830'Measuring anisotropic mechanical properties of thin films'19975,662,564'Exercise device'19975,633,711'Measurement of material properties with optically induced phonons'19975,546,811'Optical measurements of stress in thin film materials'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2019Based in Newton, MA, US· patent location history
1997–2019Patents assigned to MASSACHUSETTS INST TECHNOLOGY (25)· patent assignee history
1997–2002Based in Granite Falls, NC, US· patent location history
1998–2002Patents assigned to ACTIVE IMPULSE SYSTEMS INC (4)· patent assignee history
2010–2019Patents assigned to NELSON KEITH A (6)· patent assignee history
2010Based in Hailey, ID, US· patent location history
2014–2017Patents assigned to NELSON KEITH (4)· patent assignee history
2014–2020Based in Grimes, IA, US· patent location history
2018–2020Patents assigned to SENDERS CONSTRUCTION LLC (7)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MASSACHUSETTS INST TECHNOLOGY | 25 | 1997–2019 |
| SENDERS CONSTRUCTION LLC | 7 | 2018–2020 |
| NELSON KEITH Aself | 6 | 2010–2019 |
| ACTIVE IMPULSE SYSTEMS INC | 4 | 1998–2002 |
| NELSON KEITHself | 4 | 2014–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Newton, Massachusetts, US | 32 | 1996–2019 |
| Grimes, IA, US | 12 | 2014–2020 |
| Granite Falls, NC, US | 2 | 1997–2002 |
| Hailey, ID, US | 1 | 2010 |