Inventor
Michael Engel
Inventor
Ossining, NY, US
Overview
Patents· 24 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Lprimary
H01LSemiconductor devices19%
H10KOrganic electric solid-state devices13%
H10DInorganic electric semiconductor devices11%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
B82YSpecific uses or applications of nanostructures7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
G01FMeasuring volume, volume flow, mass flow or liquid level3%
G01RMeasuring electric variables3%
PatentTitleYear
11,029,300Detecting contamination sources in liquid distribution systems202110,830,745Miniaturized precision agriculture202010,679,849Electric field assisted placement of nanomaterials through dielectric engineering202010,605,826Calibrating tip-enhanced Raman microscopes202010,546,924Fabrication of nanomaterial T-gate transistors with charge transfer doping layer202010,431,453Electric field assisted placement of nanomaterials through dielectric engineering201910,429,303Portable and autonomous, IoT enabled, optical measurement system201910,388,805Multi-wavelength detector array incorporating two dimensional and one dimensional materials201910,386,331Particle manipulation and trapping in microfluidic devices using two-dimensional material201910,283,629Scalable process for the formation of self aligned, planar electrodes for devices employing one or two dimensional lattice structures201910,276,698Scalable process for the formation of self aligned, planar electrodes for devices employing one or two dimensional lattice structures201910,069,028Multi-wavelength detector array incorporating two dimensional and one dimensional materials20189,899,547'Multi-wavelength detector array incorporating two dimensional and one dimensional materials'20189,891,084'Graphene-based magnetic hall sensor for fluid flow analysis at nanoscale level'20189,891,294'Graphene-based magnetic hall sensor for fluid flow analysis at nanoscale level'20189,759,643'Method and integrated device for analyzing liquid flow and liquid-solid interface interaction'20179,748,334'Fabrication of nanomaterial T-gate transistors with charge transfer doping layer'20179,702,748'Graphene-based magnetic hall sensor for fluid flow analysis at nanoscale level'20179,412,815'Solution-assisted carbon nanotube placement with graphene electrodes'20169,310,285'Method and integrated device for analyzing liquid flow and liquid-solid interface interaction'20168,987,705'Carbon nanotube transistor employing embedded electrodes'20158,859,439'Solution-assisted carbon nanotube placement with graphene electrodes'20148,629,010'Carbon nanotube transistor employing embedded electrodes'20148,610,989'Optoelectronic device employing a microcavity including a two-dimensional carbon lattice structure'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013–2021Patents assigned to IBM (24)· patent assignee history
2013–2015Patents assigned to KARLSRUHER INST TECHNOLOGIE (3)· patent assignee history
2013–2014Patents assigned to AVOURIS PHAEDON (2)· patent assignee history
2013–2014Patents assigned to KRUPKE RALPH (2)· patent assignee history
2013–2014Patents assigned to STEINER MATHIAS B (2)· patent assignee history
2013–2016Based in Karlsruhe, DE· patent location history
2016–2020Based in Ossining, NY, US· patent location history
2018Based in Ossininng, NY, US· patent location history
2019–2021Based in Rio de Janeiro, BR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 24 | 2013–2021 |
| KARLSRUHER INST TECHNOLOGIE | 3 | 2013–2015 |
| AVOURIS PHAEDON | 2 | 2013–2014 |
| KRUPKE RALPH | 2 | 2013–2014 |
| STEINER MATHIAS B | 2 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ossining, New York, US | 12 | 2016–2020 |
| Rio de Janeiro, BR | 6 | 2019–2021 |
| Karlsruhe, DE | 5 | 2013–2016 |
| Ossininng, New York, US | 1 | 2018 |