Inventor
Yoshinobu Aoyagi
Inventor
Saitama, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B82Yprimary
B82YSpecific uses or applications of nanostructures13%
H10HInorganic light-emitting semiconductor devices having potential barriers13%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
G02BOptical elements, systems or apparatus9%
G21KHandling of particles or ionising radiation not otherwise provided for9%
H01JElectric discharge tubes or discharge lamps9%
H05GX-ray technique6%
B08BCleaning in general3%
B23KSoldering or unsoldering3%
C02FTreatment of water, waste water, sewage, or sludge3%
PatentTitleYear
9,278,870'Ultraviolet irradiation apparatus and ultraviolet irradiation method'20168,698,168'Semiconductor device having aluminum nitride layer with void formed therein'20148,043,978'Electronic device and method for producing electronic device'20117,691,202'Ultraviolet light-emitting device in which p-type semiconductor is used'20107,675,069'InAlGaN emitting light in ultraviolet short-wavelength region and process for preparing the same as well as ultraviolet light-emitting device using the same'20107,309,394'Ultraviolet light-emitting device in which p-type semiconductor is used'20077,301,159'Charged particle beam apparatus and method of forming electrodes having narrow gap therebetween by using the same'20077,244,385'Process for production of three-dimensional photonic crystal as well as probe used therefor'20076,865,005'Three-dimensional photonic crystal'20056,530,991'Method for the formation of semiconductor layer'20036,353,330'Single-flux-quantum digital device'20026,291,796'Apparatus for CFC-free laser surface cleaning'20016,157,701'X-ray generating apparatus and X-ray microscope'20005,832,052'X-ray microscope'19985,680,429'X-ray generating apparatus and X-ray microscope'19974,749,912'Ion-producing apparatus'19884,749,910'Electron beam-excited ion beam source'19884,131,506'Method of producing echelette gratings'1978Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1978–2000Patents assigned to RIKAGAKU KENKYUSHO (6)· patent assignee history
1978Based in Kamifukuoka, JP· patent location history
1988–2010Based in Saitama, JP· patent location history
1997–2000Patents assigned to SHIMADZU CORP (3)· patent assignee history
2002–2011Patents assigned to RIKEN (7)· patent assignee history
2003–2011Based in Wako, JP· patent location history
2005–2007Patents assigned to NAT INST FOR MATERIALS SCIENCE (2)· patent assignee history
2014Patents assigned to AOYAGI YOSHINOBU (1)· patent assignee history
2014Based in Kusatsu, JP· patent location history
2016Based in Shiga, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RIKEN | 7 | 2002–2011 |
| RIKAGAKU KENKYUSHO | 6 | 1978–2000 |
| SHIMADZU CORP | 3 | 1997–2000 |
| NAT INST FOR MATERIALS SCIENCE | 2 | 2005–2007 |
| AOYAGI YOSHINOBUself | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Saitama, JP | 9 | 1988–2010 |
| Wako, JP | 6 | 2003–2011 |
| Shiga, JP | 1 | 2016 |
| Kusatsu, JP | 1 | 2014 |
| Kamifukuoka, JP | 1 | 1978 |