Inventor
Kristof Paredis
Inventor
Oud-Heverlee, BE
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus33%
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
G01RMeasuring electric variables17%
H01JElectric discharge tubes or discharge lamps17%
H01LSemiconductor devices8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
PatentTitleYear
11,125,805Device for measuring surface characteristics of a material202111,112,427Method and tip substrate for scanning probe microscopy202110,746,759Method for determining the shape of a sample tip for atom probe tomography202010,541,108Method and apparatus for transmission electron microscopy202010,495,666Device and method for two dimensional active carrier profiling of semiconductor components2019Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2019–2021Patents assigned to IMEC VZW (5)· patent assignee history
2019–2021Based in Oud-Heverlee, BE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IMEC VZW | 5 | 2019–2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Oud-Heverlee, BE | 5 | 2019–2021 |