Inventor
Ichirou Yamaguchi
Inventor
Wako, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
B24BMachines, devices, or processes for grinding or polishing13%
B29CShaping or joining of plastics13%
B29LIndexing scheme associated with subclass b29c, relating to particular articles13%
G01BMeasuring length, thickness or similar linear dimensions13%
G03HHolographic processes or apparatus13%
G05BControl or regulating systems in general13%
PatentTitleYear
7,745,524'Puncture sealing agent'20106,246,495'Phase-shift digital holographic apparatus'20015,943,134'Method of measuring thickness and refractive indices of component layers of laminated structure and measuring apparatus for carrying out the same'19995,910,040'Method of controlling shape and NC processing apparatus utilizing the method'19995,078,488'Method and apparatus for determining refractive index distribution'1992Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1992–2001Patents assigned to RIKAGAKU KENKYUSHO (4)· patent assignee history
1992Patents assigned to SHINETSU CHEMICAL CO (1)· patent assignee history
1992–2001Based in Wako, JP· patent location history
2010Patents assigned to BRIDGESTONE CORP (1)· patent assignee history
2010Based in Kodaira, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RIKAGAKU KENKYUSHO | 4 | 1992–2001 |
| BRIDGESTONE CORP | 1 | 2010 |
| SHINETSU CHEMICAL CO | 1 | 1992 |
Locations
| Location | Patents | Span |
|---|---|---|
| Wako, JP | 4 | 1992–2001 |
| Kodaira, JP | 1 | 2010 |