LexDanaLexDanabeta
Inventor

YUKO OTANI

Inventor
JP

Overview

2→
Patents
2023–2024
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1029%
G02BOptical elements, systems or apparatus14%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices14%
G06TImage data processing or generation, in general14%
PatentTitleYear
11,982,631Defect detection device, defect detection method, and defect observation apparatus including defect detection device202411,802,841Defect detection device, defect detection method, and defect observation device2023

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2023–2024Patents assigned to HITACHI HIGH TECH CORP (2)· patent assignee history
2023–2024Based in JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP22023–2024
Locations
LocationPatentsSpan
JP22023–2024