Inventor
Amos Noy
Inventor
Jerusalem, IL
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables75%
G06FElectric digital data processing25%
PatentTitleYear
8,296,697'Method and apparatus for performing static analysis optimization in a design verification system'20127,870,523'System and method for test generation with dynamic constraints using static analysis and multidomain constraint reduction'20117,281,185'Method and apparatus for maximizing and managing test coverage'20077,114,111'Method and apparatus for maximizing test coverage'20066,684,359'System and method for test generation with dynamic constraints using static analysis'20046,519,727'System and method for applying flexible constraints'20036,219,809'System and method for applying flexible constraints'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2004Patents assigned to VERISITY LTD (3)· patent assignee history
2001–2012Based in Jerusalem, IL· patent location history
2006Patents assigned to CADENCE DESIGN ISREAL II LTD (1)· patent assignee history
2007Patents assigned to CADENCE DESIGN ISRAEL II LTD (1)· patent assignee history
2011–2012Patents assigned to CADENCE DESIGN SYSTEMS INC (2)· patent assignee history
2012Patents assigned to GAL AMIT (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| VERISITY LTD | 3 | 2001–2004 |
| CADENCE DESIGN SYSTEMS INC | 2 | 2011–2012 |
| CADENCE DESIGN ISRAEL II LTD | 1 | 2007 |
| CADENCE DESIGN ISREAL II LTD | 1 | 2006 |
| GAL AMIT | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Jerusalem, IL | 7 | 2001–2012 |