Inventor
John Joseph Salazar
Inventor
Austin, TX, US
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables91%
G06FElectric digital data processing9%
PatentTitleYear
9,916,480'Security apparatus to house a device'20187,479,796'Functional and stress testing of LGA devices'20097,466,155'Functional and stress testing of LGA devices'20087,463,017'Functional and stress testing of LGA devices'20087,456,644'Functional and stress testing of LGA devices'20087,453,279'Functional and stress testing of LGA devices'20087,425,822'Functional and stress testing of LGA devices'20087,423,440'Functional and stress testing of LGA devices'20087,405,583'Functional and stress testing of LGA devices'20087,352,200'Functional and stress testing of LGA devices'20086,911,836'Apparatus for functional and stress testing of exposed chip land grid array devices'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2009Patents assigned to IBM (10)· patent assignee history
2005–2018Based in Austin, TX, US· patent location history
2018Patents assigned to TREND MICRO INC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 10 | 2005–2009 |
| TREND MICRO INC | 1 | 2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Austin, Texas, US | 11 | 2005–2018 |