Inventor
Taizo Hashimoto
Inventor
Takasaki, JP
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1043%
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
H10DInorganic electric semiconductor devices14%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1014%
PatentTitleYear
7,977,165'Method of manufacturing a semiconductor device'20117,687,907'Semiconductor device and manufacturing method of the same'20107,335,574'Semiconductor device and manufacturing method of the same'20086,628,817'Inspection data analyzing system'20036,529,619'Inspection data analyzing system'20036,339,653'Inspection data analyzing system'20026,330,352'Inspection data analyzing system'20016,185,322'Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device'20015,841,893'Inspection data analyzing system'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2003Patents assigned to HITACHI LTD (6)· patent assignee history
1998–2003Based in Takasaki, JP· patent location history
2008–2010Patents assigned to RENESAS TECH CORP (2)· patent assignee history
2008–2011Based in Maebashi, JP· patent location history
2011Patents assigned to RENESAS ELECTRONICS CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI LTD | 6 | 1998–2003 |
| RENESAS TECH CORP | 2 | 2008–2010 |
| RENESAS ELECTRONICS CORP | 1 | 2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Takasaki, JP | 6 | 1998–2003 |
| Maebashi, JP | 3 | 2008–2011 |