Inventor
Tetsuji Anai
Inventor
Tokyo, JP
Overview
Patents· 31 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Cprimary
G01CMeasuring distances, levels or bearings24%
G06TImage data processing or generation, in general19%
G01BMeasuring length, thickness or similar linear dimensions8%
H04NPictorial communication, e.g. television8%
B64UUnmanned aerial vehicles [uav]7%
G05DSystems for controlling or regulating non-electric variables7%
G06KGraphical data reading6%
G01SRadio direction-finding5%
G01DMeasuring not specially adapted for a specific variable3%
B64CAeroplanes2%
PatentTitleYear
10,921,430Surveying system202110,520,307Surveying instrument201910,331,972Survey data processing device, survey data processing method, and program therefor201910,281,580Surveying system201910,198,632Survey data processing device, survey data processing method, and survey data processing program201910,048,063Measuring instrument and surveying system20189,911,038'Survey data processing device, survey data processing method, and program therefor'20189,897,436'Measuring instrument and surveying system'20189,736,360'Survey data processing device, survey data processing method, and program therefor'20179,648,304'Image pickup method and photographing device'20179,571,794'Surveying apparatus'20179,541,382'Rotation angle detecting apparatus and surveying instrument'20179,409,656'Aerial photographing system'20169,228,858'Rotation angle detecting apparatus'20169,171,225'Device, method, and recording medium for detecting and removing mistracked points in visual odometry systems'20159,158,305'Remote control system'20159,013,576'Aerial photograph image pickup method and aerial photograph image pickup apparatus'20159,007,461'Aerial photograph image pickup method and aerial photograph image pickup apparatus'20158,953,933'Aerial photogrammetry and aerial photogrammetric system'20158,937,278'Rotation angle detecting apparatus'20158,836,930'Rotation angle detecting apparatus and surveying instrument'20148,811,718'Position measurement method, position measurement device, and program'20148,630,755'Automatic taking-off and landing system'20147,860,302'Image processing apparatus'20107,860,276'Image processing device and method'20107,860,273'Device and method for position measurement'20107,844,077'Location measuring device and method'20107,787,689'Location measuring device and method'20107,747,150'Image processing device and method'20107,747,151'Image processing device and method'20107,726,033'Multi-point measuring method and surveying device'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2021Patents assigned to TOPCON CORP (24)· patent assignee history
2010–2021Based in Tokyo, JP· patent location history
2010–2019Based in Itabashi-ku, JP· patent location history
2014–2015Patents assigned to ANAI TETSUJI (4)· patent assignee history
2014–2015Patents assigned to OHTOMO FUMIO (3)· patent assignee history
2014–2015Patents assigned to OSARAGI KAZUKI (3)· patent assignee history
2016–2019Patents assigned to KK TOPCON (7)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOPCON CORP | 24 | 2010–2021 |
| KK TOPCON | 7 | 2016–2019 |
| ANAI TETSUJIself | 4 | 2014–2015 |
| OHTOMO FUMIO | 3 | 2014–2015 |
| OSARAGI KAZUKI | 3 | 2014–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 26 | 2010–2021 |
| Itabashi-ku, JP | 5 | 2010–2019 |