Inventor
Shigenori Nagano
Inventor
Tokyo, JP
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus25%
G01BMeasuring length, thickness or similar linear dimensions17%
G01DMeasuring not specially adapted for a specific variable17%
G01SRadio direction-finding17%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices8%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light8%
PatentTitleYear
9,995,826Electronic distance meter20189,709,676'Laser light emitting device having a mode scrambler for unifying light intensity distribution'20177,561,768'Optical branching device'20097,309,168'Optical fiber cable'20076,233,370'Interference measurement apparatus and probe used for interference measurement apparatus'20016,166,818'Interference measurement apparatus, interference measurement probe and interference measurement control system'20006,075,600'Signal formation apparatus for use in interference measurement'20005,349,431'Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide'19945,337,169'Method for patterning an optical device for optical IC, and an optical device for optical IC fabricated by this method'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994–2009Patents assigned to TOPCON CORP (7)· patent assignee history
1994–2018Based in Tokyo, JP· patent location history
2007Based in Itabashi-ku, JP· patent location history
2017–2018Patents assigned to KK TOPCON (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOPCON CORP | 7 | 1994–2009 |
| KK TOPCON | 2 | 2017–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 8 | 1994–2018 |
| Itabashi-ku, JP | 1 | 2007 |