Inventor
CHANGHOON CHOI
Inventor
US
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties22%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation17%
H01LSemiconductor devices13%
G02BOptical elements, systems or apparatus9%
H04NPictorial communication, e.g. television9%
G05FSystems for regulating electric or magnetic variables7%
G03HHolographic processes or apparatus4%
G06TImage data processing or generation, in general4%
B05DProcesses for applying fluent materials to surfaces, in general2%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form2%
PatentTitleYear
12,593,138Image signal processor and method of processing images202612,561,788Fluorescence microscopy metrology system and method of operating fluorescence microscopy metrology system202612,481,144EUV photomask inspection apparatus202512,300,711Integrated sensor for lifetime characterization202512,203,855Sensor for lifetime plus spectral characterization202512,188,870Integrated sensor with reduced skew202512,092,579Integrated sensor with reduced skew202412,045,009Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHM202411,885,744Sensor for lifetime plus spectral characterization202411,869,917Integrated sensor for lifetime characterization202411,719,639Integrated sensor for multi-dimensional signal analysis202311,573,180Integrated sensor with reduced skew202311,505,723Adhesive coating composition for non-oriented electrical steel sheet, and method for manufacturing non-oriented electrical steel sheet202211,314,205Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHM2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2026Patents assigned to SAMSUNG ELECTRONICS CO LTD (5)· patent assignee history
2022Patents assigned to POSCO (1)· patent assignee history
2022–2026Based in KR· patent location history
2023–2025Patents assigned to QUANTUM SI INC (8)· patent assignee history
2023–2025Based in US· patent location history
2026Patents assigned to IUCF HYU (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| QUANTUM SI INC | 8 | 2023–2025 |
| SAMSUNG ELECTRONICS CO LTD | 5 | 2022–2026 |
| IUCF HYU | 1 | 2026 |
| POSCO | 1 | 2022 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 8 | 2023–2025 |
| KR | 6 | 2022–2026 |