Inventor
Wen-Tung Chang
Inventor
Hsinchu, TW
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties23%
G01BMeasuring length, thickness or similar linear dimensions13%
B24BMachines, devices, or processes for grinding or polishing7%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form7%
F16HGearing7%
H01JElectric discharge tubes or discharge lamps7%
A47GHousehold or table equipment3%
B23BTurning3%
B29CShaping or joining of plastics3%
B29KIndexing scheme associated with subclasses b29b, b29c or b29d, relating to moulding materials or to materials for moulds, reinforcements, fillers or preformed parts, e.g. inserts3%
PatentTitleYear
10,800,711Ceramic and plastic composite and method for fabricating the same202010,716,422Disposable liquid-binding floor mat202010,415,962Non-contact and optical measuring automation system for the profile accuracy of disk cams and method thereof201910,151,585Non-contact and optical measuring automation system for the surface roughness value of disk cams and method thereof20189,677,876'Non-destructive and optical measurement automation system for web thickness of microdrills and method thereof'20179,296,086'Destructive and visual measurement automation system for web thickness of microdrills and method thereof'20168,602,444'Foldable hand cart'20138,520,066'Automated optical inspection system for the runout tolerance of circular saw blades'2013D0677034'Foldable hand cart'20137,268,440'Fabrication of semiconductor integrated circuit chips'20076,734,427'TEM/SEM sample preparation'20046,646,259'Method of sample preparation for transmission electron microscope analysis'20036,616,784'Method for fabricating transmission electron microscope'20036,426,500'Method for protecting a specific region in a sample applied in preparing an ultra-thin specimen'20026,388,265'Method for distinguishing a specific region in a sample to be observed by a microscope'20026,074,291'Apparatus for preparing ultra-thin specimen'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2002Patents assigned to MOSEL VITELIC INC (3)· patent assignee history
2000–2007Based in Hsinchu, TW· patent location history
2003–2007Patents assigned to UNITED MICROELECTRONICS CORP (4)· patent assignee history
2013Patents assigned to CHANG WEN-TUNG (3)· patent assignee history
2013Patents assigned to HO EDWIN (2)· patent assignee history
2013–2019Based in Taipei, TW· patent location history
2013Based in Jiaoxi Township, TW· patent location history
2016–2019Patents assigned to UNIV NAT TAIWAN OCEAN (3)· patent assignee history
2020Based in Taoyuan, TW· patent location history
2020Based in New Taipei, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNITED MICROELECTRONICS CORP | 4 | 2003–2007 |
| CHANG WEN-TUNGself | 3 | 2013 |
| MOSEL VITELIC INC | 3 | 2000–2002 |
| UNIV NAT TAIWAN OCEAN | 3 | 2016–2019 |
| HO EDWIN | 2 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hsinchu, TW | 7 | 2000–2007 |
| Taipei, TW | 5 | 2013–2019 |
| Jiaoxi Township, TW | 2 | 2013 |
| Taoyuan, TW | 1 | 2020 |
| New Taipei, TW | 1 | 2020 |