Inventor
Gilad Schwartz
Inventor
Meishar, IL
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties38%
B08BCleaning in general13%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling13%
C23CCoating metallic material13%
H01LSemiconductor devices13%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
PatentTitleYear
9,302,358'Chamber elements and a method for placing a chamber at a load position'20167,504,647'Method and apparatus for inspecting a sample having a controller for determining an estimated height of the detector from the sample'20097,115,890'Method and apparatus for inspecting a sample having a height measurement ahead of a focal area'20066,831,736'Method of and apparatus for line alignment to compensate for static and dynamic inaccuracies in scanning'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2016Patents assigned to APPLIED MATERIALS ISRAEL LTD (2)· patent assignee history
2004–2016Based in Meishar, IL· patent location history
2006–2009Patents assigned to APPLIED MATERIALS INC (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 2 | 2006–2009 |
| APPLIED MATERIALS ISRAEL LTD | 2 | 2004–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Meishar, IL | 4 | 2004–2016 |