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Inventor

Thomas J. Snethen

Inventor
Endwell, NY, US

Overview

4→
Patents
1976–2009
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables80%
G06FElectric digital data processing20%
PatentTitleYear
7,587,646'Test pattern generation in residue networks'20096,708,305'Deterministic random LBIST'20045,691,990'Hybrid partial scan method'19973,961,250'Logic network test system with simulator oriented fault test generator'1976

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1976–2004Patents assigned to IBM (3)· patent assignee history
1976Based in Wappinger Falls, NY, US· patent location history
1997–2009Based in Endwell, NY, US· patent location history
2009Patents assigned to CADENCE DESIGN SYSTEMS INC (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM31976–2004
CADENCE DESIGN SYSTEMS INC12009
Locations
LocationPatentsSpan
Endwell, New York, US31997–2009
Wappinger Falls, New York, US11976