Inventor
AHN CHOI
Inventor
KR
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables33%
G11CStatic stores33%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1033%
PatentTitleYear
12,203,980Wafer level methods of testing semiconductor devices using internally-generated test enable signals202511,867,751Wafer level methods of testing semiconductor devices using internally-generated test enable signals202411,435,397Wafer level methods of testing semiconductor devices using internally-generated test enable signals2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2025Patents assigned to SAMSUNG ELECTRONICS CO LTD (3)· patent assignee history
2022–2025Based in KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 3 | 2022–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| KR | 3 | 2022–2025 |