Inventor
Been-Der Chen
Inventor
Milpitas, CA, US
Overview
Patents· 13 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices41%
G06FElectric digital data processing24%
G06TImage data processing or generation, in general14%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%
G06NComputing arrangements based on specific computational models3%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes3%
PatentTitleYear
11,106,982Warm start generalized additive mixed-effect (game) framework20219,619,607'Method and apparatus for cost function based simultaneous OPC and SBAR optimization'20179,418,194'Method and apparatus for model based flexible MRC'20168,938,699'Multivariable solver for optical proximity correction'20158,826,198'Method and apparatus for enhancing signal strength for improved generation and placement of model-based sub-resolution assist features (MB-SRAF)'20148,812,998'Method and apparatus for cost function based simultaneous OPC and SBAR optimization'20148,806,389'Method and apparatus for model based flexible MRC'20148,560,979'Local multivariable solver for optical proximity correction in lithographic processing method, and device manufactured thereby'20138,448,099'Multivariable solver for optical proximity correction'20138,443,312'Method and apparatus for enhancing signal strength for improved generation and placement of model-based sub-resolution assist features (MB-SRAF)'20138,291,352'Multivariable solver for optical proximity correction'20128,239,786'Local multivariable solver for optical proximity correction in lithographic processing method, and device manufactured thereby'20127,707,538'Multivariable solver for optical proximity correction'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2017Based in Milpitas, CA, US· patent location history
2012–2017Patents assigned to ASML NETHERLANDS BV (11)· patent assignee history
2012–2014Patents assigned to CHEN BEEN-DER (5)· patent assignee history
2012–2014Patents assigned to LU YEN-WEN (4)· patent assignee history
2012–2013Patents assigned to WONG WILLIAM S (3)· patent assignee history
2012–2014Patents assigned to LI JIANGWEI (2)· patent assignee history
2021Based in San Jose, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 11 | 2012–2017 |
| CHEN BEEN-DERself | 5 | 2012–2014 |
| LU YEN-WEN | 4 | 2012–2014 |
| WONG WILLIAM S | 3 | 2012–2013 |
| LI JIANGWEI | 2 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Milpitas, California, US | 12 | 2010–2017 |
| San Jose, California, US | 1 | 2021 |