Inventor

Yutaka Suenaga

Inventor
Yokohama, JP

Overview

46→
Patents
1986–2013
Patent span
Physics
Primary field (CPC G)

Patents· 46 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G02Bprimary
G02BOptical elements, systems or apparatus53%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices46%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h101%
PatentTitleYear
8,351,116'Optical component and phase contrast microscope using optical component'20137,079,314'Catadioptric optical system and exposure apparatus equipped with the same'20066,856,377'Relay image optical system, and illuminating optical device and exposure system provided with the optical system'20056,844,919'Projection optical system and exposure apparatus having the projection optical system'20056,707,601'Exposure apparatus and method'2004RE038403'Projection optical system and projection exposure apparatus'20046,646,797'Exposure apparatus and method'20036,633,365'Projection optical system and exposure apparatus having the projection optical system'20036,451,507'Exposure apparatus and method'20026,452,723'Exposure apparatus and method'2002RE037846'Projection optical system and exposure apparatus using the same'20026,377,338'Exposure apparatus and method'20026,302,548'Catoptric reduction projection optical system and exposure apparatus and method using same'20016,259,557'Device and method for dark field illumination'20016,213,610'Catoptric reduction projection optical system and exposure apparatus and method using same'20016,118,596'Catadioptric reduction projection optical system and method'20006,108,140'Catadioptric reduction projection optical system and method'20006,084,723'Exposure apparatus'2000RE036740'Cata-dioptric reduction projection optical system'20005,978,155'Adapters for correcting spherical aberrations of objective lens'19995,943,172'Projection optical system and projection exposure apparatus'19995,940,220'Microscope objective lens with variable correction of aberrations imparted by transparent body between the specimen and the objective lens'19995,930,049'Projection optical system and method of using such system for manufacturing devices'19995,920,432'Microscope objective lens'19995,889,617'Objective lens systems'19995,844,728'Catadioptric reduction projection optical system'19985,835,285'Projection optical system and exposure apparatus using the same'19985,835,282'Zoom lens system'19985,831,770'Projection optical system and exposure apparatus provided therewith'19985,831,776'Projection optical system and projection exposure apparatus'19985,805,344'Projection optical system and projection exposure apparatus'19985,781,278'Projection optical system and exposure apparatus with the same'19985,751,486'Shake-preventing correction optical system'19985,712,735'Catadioptric reduction projection optical system'19985,708,531'Objective lens system'19985,694,241'Catadioptric reduction projection optical system and exposure apparatus employing the same'19975,668,673'Catadioptric reduction projection optical system'19975,592,329'Catadioptric optical system'19975,589,988'Retrofocus-type wide angle lens system having a fixed front lens group and a movable rear lens group'19965,532,878'Objective lens system for microscope'19965,477,388'Inverse telescopic wide angle lens'19955,220,454'Cata-dioptric reduction projection optical system'19934,798,962'Multi-wavelength projection exposure and alignment apparatus'19894,795,244'Projection type exposure apparatus'19894,723,845'Optical apparatus for the detection of position'19884,626,079'Dark field illumination apparatus for epi-illumination system'1986

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1986–2004Patents assigned to NIPPON KOGAKU KK (5)· patent assignee history
1986–2006Based in Yokohama, JP· patent location history
1988–1989Based in Kawasaki, JP· patent location history
1989–2006Patents assigned to NIKON CORP (39)· patent assignee history
2000–2005Based in Tokyo, JP· patent location history
2013Patents assigned to SUENAGA YUTAKA (1)· patent assignee history
2013Based in Kanagawa, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
NIKON CORP391989–2006
NIPPON KOGAKU KK51986–2004
SUENAGA YUTAKAself12013
Locations
LocationPatentsSpan
Yokohama, JP401986–2006
Kawasaki, JP31988–1989
Tokyo, JP22000–2005
Kanagawa, JP12013