Inventor
Sheng-Yuan Hsueh
Inventor
Tainan, TW
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Lprimary
H01LSemiconductor devices27%
H10DInorganic electric semiconductor devices16%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1016%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices7%
H10BElectronic memory devices7%
H10NElectric solid-state devices not otherwise provided for7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
G06FElectric digital data processing5%
G11CStatic stores4%
G01BMeasuring length, thickness or similar linear dimensions2%
PatentTitleYear
10,991,757Magnetoresistive random access memory202110,985,211Embedded MRAM structure and method of fabricating the same202110,983,428Mask and method of forming pattern202110,867,999Semiconductor device and method of forming the same202010,777,508Semiconductor device202010,700,126Magnetoresistive random access memory wherein number of memory cells in each string is equal to number of strings connected in parallel202010,692,928Semiconductor device and method for fabricating the same202010,580,8831-1 fin forced stack inverter202010,566,290Alignment mark and measurement method thereof202010,529,707Intra-metal capacitor and method of forming the same202010,256,155Method for fabricating single diffusion break structure directly under a gate line201910,247,774Test key structure and method of measuring resistance of vias201910,002,864Intra-metal capacitor and method of forming the same20189,147,678'Resistor and fabrication method thereof'20158,890,551'Test key structure and method for measuring step height by such test key structure'20148,850,370'Method of manufacturing semiconductor circuit structure'20148,624,398'Semiconductor circuit structure'20147,932,104'Method for inspecting photoresist pattern'20117,190,044'Fuse structure for a semiconductor device'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2021Patents assigned to UNITED MICROELECTRONICS CORP (19)· patent assignee history
2007Based in Hsinchu County, TW· patent location history
2011–2021Based in Tainan, TW· patent location history
2014–2015Patents assigned to HSU SHIH-CHIEH (3)· patent assignee history
2014–2015Patents assigned to HSUEH SHENG-YUAN (3)· patent assignee history
2014–2015Patents assigned to SUN CHIA-CHEN (3)· patent assignee history
2014–2015Patents assigned to CHIH SHU-HSUAN (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNITED MICROELECTRONICS CORP | 19 | 2007–2021 |
| HSU SHIH-CHIEH | 3 | 2014–2015 |
| HSUEH SHENG-YUANself | 3 | 2014–2015 |
| SUN CHIA-CHEN | 3 | 2014–2015 |
| CHIH SHU-HSUAN | 2 | 2014–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tainan, TW | 18 | 2011–2021 |
| Hsinchu County, TW | 1 | 2007 |