Inventor
Junzhao Lei
Inventor
San Jose, CA, US
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H04Nprimary
H04NPictorial communication, e.g. television24%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation20%
A61BDiagnosis12%
G01NInvestigating or analysing materials by determining their chemical or physical properties12%
H01LSemiconductor devices12%
C12MApparatus for enzymology or microbiology4%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms4%
G01RMeasuring electric variables4%
H10HInorganic light-emitting semiconductor devices having potential barriers4%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h104%
PatentTitleYear
9,757,015'Imaging systems and methods for using in spatially constrained locations'20179,574,989'Lens-free imaging system and method for detecting particles in sample deposited on image sensor'20179,538,909'Self-illuminating CMOS imaging package'20179,347,082'Automated cell growth/migration detection system and associated methods'20169,332,193'Synchronization of image acquisition in multiple image sensors with a synchronization clock signal'20169,319,603'Shared terminal of an image sensor system for transferring image data and control signals'20169,119,544'Acquiring global shutter-type video images with CMOS pixel array by strobing light during vertical blanking period in otherwise dark environment'20158,890,945'Shared terminal of an image sensor system for transferring image data and control signals'20148,810,670'Shared terminal of an image sensor system for transferring clock and control signals'20148,785,885'Fluorescence imaging module'20147,020,582'Methods and apparatus for laser marking of integrated circuit faults'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006Patents assigned to ALTERA CORP (1)· patent assignee history
2006Based in Santa Clara, CA, US· patent location history
2014–2017Patents assigned to OMNIVISION TECH INC (10)· patent assignee history
2014Patents assigned to DAI TIEJUN (2)· patent assignee history
2014Patents assigned to LEI JUNZHAO (2)· patent assignee history
2014–2017Based in San Jose, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OMNIVISION TECH INC | 10 | 2014–2017 |
| DAI TIEJUN | 2 | 2014 |
| LEI JUNZHAOself | 2 | 2014 |
| ALTERA CORP | 1 | 2006 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 10 | 2014–2017 |
| Santa Clara, California, US | 1 | 2006 |