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Inventor

Craig Prater

Inventor
Santa Barbara, CA, US

Overview

45→
Patents
1992–2021
Patent span
Physics
Primary field (CPC G)

Patents· 45 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Qprimary
G01QScanning-probe techniques or apparatus44%
G01NInvestigating or analysing materials by determining their chemical or physical properties21%
B82YSpecific uses or applications of nanostructures20%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
G02BOptical elements, systems or apparatus2%
H01JElectric discharge tubes or discharge lamps2%
G06NComputing arrangements based on specific computational models1%
PatentTitleYear
11,002,665Method and apparatus for enhanced photo-thermal imaging and spectroscopy202110,969,405Method and apparatus for sub-diffraction infrared imaging and spectroscopy and complementary techniques202110,942,116Method and apparatus for enhanced photo-thermal imaging and spectroscopy202110,914,755Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy202110,809,184Method and apparatus for reducing noise in spectroscopic data at a point on a sample202010,557,789Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy202010,473,693Method and apparatus for infrared scanning near-field optical microscopy based on photothermal effect201910,241,131Method and apparatus for chemical and optical imaging with a broadband source201910,228,388Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy201910,228,389Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression201910,082,523Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy20189,778,282'Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy'20179,658,247'Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy'20179,523,707'Closed loop controller and method for fast scanning probe microscopy'20169,372,154'Method and apparatus for infrared scattering scanning near-field optical microscopy'20169,244,096'Closed loop controller and method for fast scanning probe microscopy'20169,134,341'Multiple modulation heterodyne infrared spectroscopy'20159,046,492'Stimulated raman nanospectroscopy'20158,914,911'Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy'20148,904,560'Closed loop controller and method for fast scanning probe microscopy'20148,869,602'High frequency deflection measurement of IR absorption'20148,793,811'Method and apparatus for infrared scattering scanning near-field optical microscopy'20148,680,467'High frequency deflection measurement of IR absorption with a modulated IR source'20148,646,319'Dynamic power control for nanoscale spectroscopy'20148,533,861'Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy'20138,443,459'Fast-scanning SPM scanner and method of operating same'20138,418,538'High frequency deflection measurement of IR absorption'20138,402,819'High frequency deflection measurement of IR absorption'20138,387,443'Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer'20138,322,220'Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection'20128,242,448'Dynamic power control, beam alignment and focus for nanoscale spectroscopy'20128,177,422'Transition temperature microscopy'20128,161,805'Method and apparatus for obtaining quantitative measurements using a probe based instrument'20128,166,567'Fast-scanning SPM scanner and method of operating same'20128,087,288'Scanning stylus atomic force microscope with cantilever tracking and optical access'20127,770,231'Fast-scanning SPM and method of operating same'20107,748,260'Thermal mechanical drive actuator, thermal probe and method of thermally driving a probe'20107,617,719'Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging'20097,596,990'Method and apparatus for obtaining quantitative measurements using a probe based instrument'20096,032,518'Scanning stylus atomic force microscope with cantilever tracking and optical access'20005,714,682'Scanning stylus atomic force microscope with cantilever tracking and optical access'19985,705,814'Scanning probe microscope having automatic probe exchange and alignment'19985,560,244'Scanning stylus atomic force microscope with cantilever tracking and optical access'19965,463,897'Scanning stylus atomic force microscope with cantilever tracking and optical access'19955,166,520'Universal, microfabricated probe for scanning probe microscopes'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2016Based in Goleta, CA, US· patent location history
1995–2021Based in Santa Barbara, CA, US· patent location history
2012–2016Patents assigned to PRATER CRAIG (18)· patent assignee history
2012–2021Patents assigned to BRUKER NANO INC (14)· patent assignee history
2012–2015Patents assigned to KJOLLER KEVIN (9)· patent assignee history
2012–2018Patents assigned to ANASYS INSTR (8)· patent assignee history
2012–2015Patents assigned to ANASYS INSTR CORP (5)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
PRATER CRAIGself182012–2016
BRUKER NANO INC142012–2021
KJOLLER KEVIN92012–2015
ANASYS INSTR82012–2018
ANASYS INSTR CORP52012–2015
Locations
LocationPatentsSpan
Santa Barbara, California, US381995–2021
Goleta, California, US71992–2016