Inventor
Takashi Funatsu
Inventor
Tokyo, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B01Lprimary
B01LChemical or physical laboratory apparatus for general use14%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms14%
B01FMixing, e.g. dissolving, emulsifying or dispersing7%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry7%
B29CShaping or joining of plastics7%
B29LIndexing scheme associated with subclass b29c, relating to particular articles7%
B62DMotor vehicles7%
F15CFluid-circuit elements predominantly used for computing or control purposes7%
F16KValves7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
PatentTitleYear
10,301,682Fluidic device, exosome analysis method, biomolecule analysis method, and biomolecule detection method20199,850,535Nucleic acid detection method, detection probe, detection probe set, and nucleic acid quantification method20177,303,714'Cross member and manufacturing method thereof'20077,204,263'Flow control method for micro system'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007Patents assigned to CALSONIC KANSEI CORP (1)· patent assignee history
2007Patents assigned to JAPAN SCIENCE & TECH CORP (1)· patent assignee history
2007–2019Based in Tokyo, JP· patent location history
2007Based in Tatebayashi, JP· patent location history
2017–2019Patents assigned to UNIV TOKYO (2)· patent assignee history
2017Patents assigned to NIPPON KOGAKU KK (1)· patent assignee history
2019Patents assigned to NIKON CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNIV TOKYO | 2 | 2017–2019 |
| CALSONIC KANSEI CORP | 1 | 2007 |
| JAPAN SCIENCE & TECH CORP | 1 | 2007 |
| NIKON CORP | 1 | 2019 |
| NIPPON KOGAKU KK | 1 | 2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 3 | 2007–2019 |
| Tatebayashi, JP | 1 | 2007 |