Inventor
Kohei Hironaka
Inventor
Nagano, JP
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables47%
H01RElectrically-conductive connections24%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
H01LSemiconductor devices6%
PatentTitleYear
10,274,517Conductive probe for inspection and semiconductor inspection device201910,120,011Test unit201810,082,525Probe unit20188,633,724'Probe-unit base member and probe unit'20148,344,747'Probe unit'20138,096,840'Conductive contact holder and conductive contact unit'20127,845,955'Conductive contact holder'20107,815,438'Needle-like member, conductive contact, and conductive contact unit'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2019Patents assigned to NHK SPRING CO LTD (8)· patent assignee history
2010–2018Based in Nagano, JP· patent location history
2012–2014Patents assigned to HIRONAKA KOHEI (3)· patent assignee history
2012–2014Patents assigned to KONDO MITSUHIRO (2)· patent assignee history
2013–2014Patents assigned to KAZAMA TOSHIO (2)· patent assignee history
2013Patents assigned to ISHIKAWA SHIGEKI (1)· patent assignee history
2013–2019Based in Kamiina-gun, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NHK SPRING CO LTD | 8 | 2010–2019 |
| HIRONAKA KOHEIself | 3 | 2012–2014 |
| KAZAMA TOSHIO | 2 | 2013–2014 |
| KONDO MITSUHIRO | 2 | 2012–2014 |
| ISHIKAWA SHIGEKI | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nagano, JP | 6 | 2010–2018 |
| Kamiina-gun, JP | 2 | 2013–2019 |