Inventor
Allon Adir
Inventor
Kiryat Tivon, IL
Overview
Patents· 35 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing63%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes15%
G06NComputing arrangements based on specific computational models7%
H04LTransmission of digital information, e.g. telegraphic communication7%
G01RMeasuring electric variables6%
G06KGraphical data reading2%
PatentTitleYear
11,048,729Cluster evaluation in unsupervised learning of continuous data202110,885,204Method and system for semantic preserving location encryption202110,878,071Biometric authentication anomaly detection202010,831,785Identifying security breaches from clustering properties202010,834,111Method and system for email phishing attempts identification and notification through organizational cognitive solutions202010,657,263Management of alerts using a budget-dependent adjustable working threshold202010,397,259Cyber security event detection201910,242,087Cluster evaluation in unsupervised learning of continuous data201910,095,774Cluster evaluation in unsupervised learning of continuous data20189,928,378'Sensitive data obfuscation in output files'20189,898,395'Unit-level formal verification for vehicular software systems'20189,886,369'Dynamic data fabrication for database applications'20189,875,175Unit-level formal verification for vehicular software systems20189,870,313'Unit-level formal verification for vehicular software systems'20189,588,877'Unit-level formal verification for vehicular software systems'20179,501,654'Sensitive data obfuscation in output files'20168,892,386'Method and apparatus for post-silicon testing'20148,806,270'Method, apparatus and product for testing transactions'20148,589,734'Verifying correctness of processor transactions'20138,516,229'Two pass test case generation using self-modifying instruction replacement'20138,458,652'Device, system and method of modeling homogeneous information'20138,412,507'Testing the compliance of a design with the synchronization requirements of a memory model'20138,359,456'Generating random addresses for verification of distributed computerized devices'20138,352,525'Generating a number based on a bitset constraint'20138,280,713'Automatic generation of test suite for processor architecture compliance'20128,224,614'Generating a combination exerciser for executing tests on a circuit'20128,055,492'Non-unique results in design verification by test programs'20117,945,888'Model-based hardware exerciser, device, system and method thereof'20117,834,783'Converting a mask constraint into a bitset constraint'20107,571,201'Method for distributed joint pseudo random decision making'20097,434,101'Highly specialized scenarios in random test generation'20087,386,521'Automatic test program generation using extended conditional constraint satisfaction'20087,370,296'Modeling language and method for address translation design mechanisms in test generation'20087,133,816'Test quality through resource reallocation'20066,925,405'Adaptive test program generation'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2021Patents assigned to IBM (34)· patent assignee history
2005–2021Based in Kiryat Tivon, IL· patent location history
2012–2018Patents assigned to ADIR ALLON (11)· patent assignee history
2012–2014Patents assigned to NAHIR AMIR (3)· patent assignee history
2012–2013Patents assigned to ASAF SIGAL (2)· patent assignee history
2013Patents assigned to LUDDEN JOHN MARTIN (2)· patent assignee history
2020Based in Kiryat Bialik, IL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 34 | 2005–2021 |
| ADIR ALLONself | 11 | 2012–2018 |
| NAHIR AMIR | 3 | 2012–2014 |
| ASAF SIGAL | 2 | 2012–2013 |
| LUDDEN JOHN MARTIN | 2 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kiryat Tivon, IL | 34 | 2005–2021 |
| Kiryat Bialik, IL | 1 | 2020 |