Inventor
Juren Ding
Inventor
Hong Kong, CN
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Bprimary
G11BInformation storage based on relative movement between record carrier and transducer31%
G01RMeasuring electric variables21%
B82YSpecific uses or applications of nanostructures17%
Y10TTechnical subjects covered by former us classification10%
G06FElectric digital data processing4%
H10NElectric solid-state devices not otherwise provided for4%
B24BMachines, devices, or processes for grinding or polishing2%
G01KMeasuring temperature2%
G06NComputing arrangements based on specific computational models2%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes2%
PatentTitleYear
11,030,064Facilitating classification of equipment failure data202110,901,810Event-based record and replay for advanced applications202110,486,283Manufacturing method of a slider20199,899,046'Method of testing anti-high temperature performance of a magnetic head and apparatus thereof'20189,355,660'Testing method of a magnetic head, and testing apparatus thereof'20169,208,805'Method for evaluating bit error rate for a magnetic head by using a quasi-static test system, and system thereof'20159,121,888'Method of testing anti-high temperature performance of a magnetic head and apparatus thereof'20159,019,665'Reader sensor, magnetic head, head gimbal assembly and disk drive unit with the same'20158,984,738'Manufacturing method of a slider and manufacturing apparatus thereof'20158,935,132'Spectral simulation method during noise testing for a magnetic head, and noise-testing method for a magnetic head by using the same'20158,767,356'Magnetoresistive sensor with funnel-shaped free layer, magnetic head, head gimbal assembly, and disk drive unit with the same'20148,675,319'Data reader with heusler alloy reference lamination'20148,664,950'Method for measuring longitudinal bias magnetic field in a tunnel magnetoresistive sensor'20148,634,157'Close loop method for measuring head SNR and media SNR'20148,594,967'Method for measuring the temperature rise induced by bias current/bias voltage in a magnetic tunnel junction'20138,582,248'Magnetoresistive sensor, including non-magnetic conducting layer embedded in shielding layer and magnetic head, head gimbal assembly and disk drive unit with the same'20138,551,626'CCP-CPP magnetoresistive reader with high GMR value'20138,318,030'Magnetic device definition with uniform biasing control'20128,295,011'Slider, head gimbal assembly and disk drive unit with the same'20126,449,135'Overlaid MR structure with magnetostatic stabilized soft adjacent layer'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2018Patents assigned to DING JUREN (14)· patent assignee history
2012–2019Patents assigned to SAE MAGNETICS HK LTD (13)· patent assignee history
2012–2014Based in Eden Prairie, MN, US· patent location history
2012–2013Based in Dongguan, CN· patent location history
2013–2018Patents assigned to NI RONGKWANG (10)· patent assignee history
2013–2018Patents assigned to LEUNG CHEUKWING (9)· patent assignee history
2013–2018Patents assigned to LUENG CHIUMING (9)· patent assignee history
2013–2019Based in Hong Kong, CN· patent location history
2021Based in New Territories, CN· patent location history
2021Based in Shanghai, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| DING JURENself | 14 | 2012–2018 |
| SAE MAGNETICS HK LTD | 13 | 2012–2019 |
| NI RONGKWANG | 10 | 2013–2018 |
| LEUNG CHEUKWING | 9 | 2013–2018 |
| LUENG CHIUMING | 9 | 2013–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hong Kong, CN | 12 | 2013–2019 |
| Eden Prairie, Minnesota, US | 3 | 2012–2014 |
| Dongguan, CN | 2 | 2012–2013 |
| New Territories, CN | 1 | 2021 |
| Shanghai, CN | 1 | 2021 |