Inventor
Russell A. Wincheski
Inventor
Williamsburg, VA, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties22%
B82YSpecific uses or applications of nanostructures14%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests11%
C01BNon-metallic elements8%
B29CShaping or joining of plastics6%
C08GMacromolecular compounds obtained otherwise than by reactions only involving unsaturated carbon-to-carbon bonds6%
H01BCables6%
H01FMagnets6%
Y10TTechnical subjects covered by former us classification6%
D01DMechanical methods or apparatus in the manufacture of artificial filaments, threads, fibres, bristles or ribbons3%
PatentTitleYear
11,097,499Polyaniline/carbon nanotube sheet nanocomposites202110,464,271Polyaniline/carbon nanotube sheet nanocomposites201910,139,345Magnetic and Raman based method for process control during fabrication of carbon nanotube based structures20188,717,012'Eddy current probe for surface and sub-surface inspection'20148,164,328'Eddy current system and method for crack detection'20128,147,920'Controlled deposition and alignment of carbon nanotubes'20127,901,611'Method for predicting and optimizing system parameters for electrospinning system'20117,491,428'Controlled deposition and alignment of carbon nanotubes'20097,278,324'Carbon nanotube-based sensor and method for detection of crack growth in a structure'20077,129,467'Carbon nanotube based light sensor'20066,888,346'Magnetoresistive flux focusing eddy current flaw detection'20056,190,589'Fabrication of molded magnetic article'20016,054,210'Molded magnetic article'20005,942,894'Radially focused eddy current sensor for detection of longitudinal flaws in metallic tubes'19995,847,562'Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm'19985,698,977'Eddy current method for fatigue testing'19975,648,721'Rotating flux-focusing eddy current probe for flaw detection'19975,617,024'Flux focusing eddy current probe'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997Patents assigned to US ARMY (3)· patent assignee history
1997–2021Based in Williamsburg, VA, US· patent location history
1998–2021Patents assigned to NASA (14)· patent assignee history
2012–2014Patents assigned to WINCHESKI RUSSELL A (3)· patent assignee history
2012–2014Patents assigned to SIMPSON JOHN W (2)· patent assignee history
2012Patents assigned to JORDAN JEFFREY D (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NASA | 14 | 1998–2021 |
| US ARMY | 3 | 1997 |
| WINCHESKI RUSSELL Aself | 3 | 2012–2014 |
| SIMPSON JOHN W | 2 | 2012–2014 |
| JORDAN JEFFREY D | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Williamsburg, Virginia, US | 18 | 1997–2021 |