Inventor
Willem Jan Grootjans
Inventor
Veldhoven, NL
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties38%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices38%
G01BMeasuring length, thickness or similar linear dimensions13%
G06FElectric digital data processing13%
PatentTitleYear
9,760,018'Method and inspection apparatus and computer program product for assessing a quality of reconstruction of a value of a parameter of interest of a structure'20179,518,936'Method and apparatus for determining lithographic quality of a structure'20168,868,387'Method of optimizing a model, a method of measuring a property, a device manufacturing method, a spectrometer and a lithographic apparatus'2014Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2014–2017Patents assigned to ASML NETHERLANDS BV (3)· patent assignee history
2014Patents assigned to CRAMER HUGO AUGUSTINUS JOSEPH (1)· patent assignee history
2014Patents assigned to DEN BOEF ARIE JEFFREY (1)· patent assignee history
2014Patents assigned to GROOTJANS WILLEM JAN (1)· patent assignee history
2014Patents assigned to KRIST JOUKE (1)· patent assignee history
2014Based in Eindhoven, NL· patent location history
2016–2017Based in Veldhoven, NL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 3 | 2014–2017 |
| CRAMER HUGO AUGUSTINUS JOSEPH | 1 | 2014 |
| DEN BOEF ARIE JEFFREY | 1 | 2014 |
| GROOTJANS WILLEM JANself | 1 | 2014 |
| KRIST JOUKE | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Veldhoven, NL | 2 | 2016–2017 |
| Eindhoven, NL | 1 | 2014 |