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Inventor

Cunlin Zhang

Inventor
Beijing, CN

Overview

1→
Patents
2016
Patent span
Physics
Primary field (CPC G)

Patents· 1 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions50%
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
PatentTitleYear
9,464,891'Method for measuring thickness by pulsed infrared thermal wave technology'2016

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2016Patents assigned to BEIJING WAITEKSIN ADVANCED TECH CO LTD (1)· patent assignee history
2016Patents assigned to FENG LICHUN (1)· patent assignee history
2016Patents assigned to TAO NING (1)· patent assignee history
2016Patents assigned to UNIV CAPITAL NORMAL (1)· patent assignee history
2016Patents assigned to UNIV CHONGQING NORMAL (1)· patent assignee history
2016Based in Beijing, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
BEIJING WAITEKSIN ADVANCED TECH CO LTD12016
FENG LICHUN12016
TAO NING12016
UNIV CAPITAL NORMAL12016
UNIV CHONGQING NORMAL12016
Locations
LocationPatentsSpan
Beijing, CN12016