Inventor

Randy J. Schwindt

Inventor

Portland, OR, US

Overview

1994–2009

Patent span

Physics

Primary field (CPC G)

Patents· 29 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables43%

A46DManufacture of brushes18%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%

B82YSpecific uses or applications of nanostructures10%

H01RElectrically-conductive connections10%

PatentTitleYear

7,589,518'Wafer probe station having a skirting component'2009 7,504,842'Probe holder for testing of a test device'2009 7,492,147'Wafer probe station having a skirting component'2009 7,330,023'Wafer probe station having a skirting component'2008 7,221,174'Probe holder for testing of a test device'2007 7,071,718'Low-current probe card'2006 7,057,407'Probe holder for testing of a test device'2006 6,995,579'Low-current probe card'2006 6,980,012'Wafer probe station for low-current measurements'2005 6,850,082'Probe holder for testing of a test device'2005 6,781,396'Low-current probe card'2004 6,720,782'Wafer probe station for low-current measurements'2004 6,507,208'Low-current probe card'2003 6,496,024'Probe holder for testing of a test device'2002 6,492,822'Wafer probe station for low-current measurements'2002 6,384,615'Probe holder for low current measurements'2002 6,335,628'Wafer probe station for low-current measurements'2002 6,249,133'Low-current probe card'2001 6,232,789'Probe holder for low current measurements'2001 6,232,788'Wafer probe station for low-current measurements'2001 6,137,302'Low-current probe card with reduced triboelectric current generating cables'2000 6,075,376'Low-current probe card'2000 6,031,383'Probe station for low current, low voltage parametric measurements using multiple probes'2000 5,729,150'Low-current probe card with reduced triboelectric current generating cables'1998 5,663,653'Wafer probe station for low-current measurements'1997 5,610,529'Probe station having conductive coating added to thermal chuck insulator'1997 5,457,398'Wafer probe station having full guarding'1995 5,434,512'Wafer probe station having integrated guarding, Kelvin connection and shielding systems'1995 5,345,170'Wafer probe station having integrated guarding, Kelvin connection and shielding systems'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–2009Patents assigned to CASCADE MICROTECH INC (25)· patent assignee history

1994–2009Based in Portland, OR, US· patent location history

2000Patents assigned to WENTWORTH LAB INC (1)· patent assignee history

2000–2009Based in New Milford, CT, US· patent location history

2005Patents assigned to CASCASE MICROTECH INC (1)· patent assignee history

2005Patents assigned to CASECADE MICROTECH INC (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
CASCADE MICROTECH INC	25	1994–2009
CASCASE MICROTECH INC	1	2005
CASECADE MICROTECH INC	1	2005
WENTWORTH LAB INC	1	2000

Locations

Location	Patents	Span
Portland, OR, US	21	1994–2009
New Milford, CT, US	8	2000–2009