Inventor
Ashish Jain
Inventor
Austin, TX, US
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing22%
G01RMeasuring electric variables20%
Y02DClimate change mitigation technologies in information and communication technologies [ict], i.e. information and communication technologies aiming at the reduction of their own energy use15%
Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications7%
G11CStatic stores5%
A24BManufacture or preparation of tobacco for smoking or chewing2%
E21BEarth or rock drilling2%
F03BMachines or engines for liquids2%
F04BPositive-displacement machines for liquids2%
F04DNon-positive-displacement pumps2%
PatentTitleYear
10,648,301Method and system for pressure regulation of well fluid from a hydrocarbon well202010,624,384Cured leaf separator202010,151,786Estimating leakage currents based on rates of temperature overages or power overages201810,123,225Time of day-triggered usage monitoring20189,958,921Power management to change power limits based on device skin temperature20189,785,218'Performance state selection for low activity scenarios'20179,672,310'Reliability guardband compensation'20179,477,289'Dynamic power allocation based on PHY power estimation'20169,298,243'Selection of an operating point of a memory physical layer interface and a memory controller based on memory bandwidth utilization'20169,261,935'Allocating power to compute units based on energy efficiency'20169,261,949'Method for adaptive performance optimization of the soc'20168,947,070'Apparatus and method for testing driver writeability strength on an integrated circuit'20158,386,523'Random access audio decoder'20138,301,943'Pulse flop with enhanced scan implementation'20128,154,275'Apparatus and method for testing sense amplifier thresholds on an integrated circuit'20128,125,211'Apparatus and method for testing driver writeability strength on an integrated circuit'20128,027,213'Mechanism for measuring read current variability of SRAM cells'20117,977,998'Apparatus and method for testing level shifter voltage thresholds on an integrated circuit'20117,454,674'Digital jitter detector'20087,411,409'Digital leakage detector that detects transistor leakage current in an integrated circuit'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008Patents assigned to PA SEMI INC (2)· patent assignee history
2008Based in Mountain View, CA, US· patent location history
2011–2017Patents assigned to APPLE INC (7)· patent assignee history
2011–2017Based in Santa Clara, CA, US· patent location history
2012–2015Patents assigned to JAIN ASHISH R (4)· patent assignee history
2012–2015Patents assigned to KLASS EDGARDO F (4)· patent assignee history
2016–2018Patents assigned to ADVANCED MICRO DEVICES INC (7)· patent assignee history
2016–2018Based in Austin, TX, US· patent location history
2020Based in Sandvika, NO· patent location history
2020Based in Glen Allen, VA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANCED MICRO DEVICES INC | 7 | 2016–2018 |
| APPLE INC | 7 | 2011–2017 |
| JAIN ASHISH Rself | 4 | 2012–2015 |
| KLASS EDGARDO F | 4 | 2012–2015 |
| PA SEMI INC | 2 | 2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Austin, Texas, US | 7 | 2016–2018 |
| Santa Clara, California, US | 7 | 2011–2017 |
| Mountain View, California, US | 2 | 2008 |
| Sandvika, NO | 1 | 2020 |
| Glen Allen, Virginia, US | 1 | 2020 |