Inventor
Hisashi Konaka
Inventor
Hamura, JP
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
B82YSpecific uses or applications of nanostructures14%
C07BGeneral methods of organic chemistry14%
G06FElectric digital data processing14%
G16CComputational chemistry14%
G21KHandling of particles or ionising radiation not otherwise provided for14%
PatentTitleYear
10,876,979Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction202010,296,725Structure refining apparatus, method and program20198,340,248'X-ray diffraction method and X-ray diffraction apparatus'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2020Patents assigned to RIGAKU DENKI CO LTD (3)· patent assignee history
2012Patents assigned to KONAKA HISASHI (1)· patent assignee history
2012Patents assigned to TORAYA HIDEO (1)· patent assignee history
2012–2019Based in Hamura, JP· patent location history
2020Based in Akiruno, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RIGAKU DENKI CO LTD | 3 | 2012–2020 |
| KONAKA HISASHIself | 1 | 2012 |
| TORAYA HIDEO | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hamura, JP | 2 | 2012–2019 |
| Akiruno, JP | 1 | 2020 |