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Inventor

Anirudha Vaidya

Inventor
Oviedo, FL, US

Overview

1→
Patents
2012
Patent span
Physics
Primary field (CPC G)

Patents· 1 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions100%
PatentTitleYear
8,300,232'Method of measuring coating thickness using infrared light'2012

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2012Patents assigned to ALLEN DAVID B (1)· patent assignee history
2012Patents assigned to SANSOM DAVID G (1)· patent assignee history
2012Patents assigned to SIEMENS ENERGY INC (1)· patent assignee history
2012Patents assigned to VAIDYA ANIRUDHA (1)· patent assignee history
2012Based in Oviedo, FL, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ALLEN DAVID B12012
SANSOM DAVID G12012
SIEMENS ENERGY INC12012
VAIDYA ANIRUDHAself12012
Locations
LocationPatentsSpan
Oviedo, Florida, US12012