Inventor
Xinya Lei
Inventor
Boise, ID, US
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices47%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them20%
A47HFurnishings for windows or doors7%
E06BFixed or movable closures for openings in buildings, vehicles, fences or like enclosures in general, e.g. doors, windows, blinds, gates7%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
PatentTitleYear
10,988,981Pull-cord control device for curtain without operation cord20218,916,314'Reduced lens heating methods, apparatus, and systems'20148,323,859'Optical compensation devices, systems, and methods'20128,173,333'Reduced lens heating methods, apparatus, and systems'20128,062,814'Optical compensation devices, systems, and methods'20117,985,658'Method of forming substrate for use in imager devices'20117,947,412'Reduced lens heating methods, apparatus, and systems'20117,864,294'Focus sensitive lithographic apparatus, systems, and methods'20117,790,338'Optical compensation devices, systems, and methods'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2014Patents assigned to MICRON TECHNOLOGY INC (7)· patent assignee history
2010–2014Based in Boise, ID, US· patent location history
2011–2014Patents assigned to LEI XINYA (4)· patent assignee history
2011–2014Patents assigned to WANG FEI (4)· patent assignee history
2011–2012Patents assigned to BALUSWAMY PARY (2)· patent assignee history
2011Patents assigned to APTINA IMAGING CORP (1)· patent assignee history
2011Based in Sunnyvale, CA, US· patent location history
2021Based in Shenzhen, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MICRON TECHNOLOGY INC | 7 | 2010–2014 |
| LEI XINYAself | 4 | 2011–2014 |
| WANG FEI | 4 | 2011–2014 |
| BALUSWAMY PARY | 2 | 2011–2012 |
| APTINA IMAGING CORP | 1 | 2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Boise, ID, US | 7 | 2010–2014 |
| Shenzhen, CN | 1 | 2021 |
| Sunnyvale, California, US | 1 | 2011 |