Inventor
Frank C. Demarest
Inventor
Higganum, CT, US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions54%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices18%
G01DMeasuring not specially adapted for a specific variable7%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light7%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them4%
H01LSemiconductor devices4%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%
PatentTitleYear
9,146,093'Non-harmonic cyclic error compensation in interferometric encoder systems'20158,913,226'Cyclic error compensation in interferometric encoder systems'20147,616,322'Cyclic error compensation in interferometry systems'20097,576,868'Cyclic error compensation in interferometry systems'20097,542,147'Data age compensation with avalanche photodiode'20097,428,685'Cyclic error compensation in interferometry systems'20086,975,406'Glitch filter for distance measuring interferometry'20056,597,459'Data age adjustments'20036,529,279'Interferometer and method for measuring the refractive index and optical path length effects of air'20036,525,826'Interferometer and method for measuring the refractive index and optical path length effects of air'20036,525,825'Interferometer and method for measuring the refractive index and optical path length effects of air'20036,407,816'Interferometer and method for measuring the refractive index and optical path length effects of air'20026,327,039'Interferometer and method for measuring the refractive index and optical path length effects of air'20016,219,144'Apparatus and method for measuring the refractive index and optical path length effects of air using multiple-pass interferometry'20015,767,972'Method and apparatus for providing data age compensation in an interferometer'19984,427,296'Electro-optical measuring system'19844,332,475'Edge timing in an optical measuring apparatus'1982Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1982–2015Patents assigned to ZYGO CORP (17)· patent assignee history
1982–1984Based in Killingworth, CT, US· patent location history
1998–2003Based in Middletown, CT, US· patent location history
2003–2015Based in Higganum, CT, US· patent location history
2014Patents assigned to DEMAREST FRANK C (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZYGO CORP | 17 | 1982–2015 |
| DEMAREST FRANK Cself | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Higganum, CT, US | 8 | 2003–2015 |
| Middletown, CT, US | 7 | 1998–2003 |
| Killingworth, CT, US | 2 | 1982–1984 |