LexDanaLexDanabeta
Inventor

Takashi Noda

Inventor
Tochigi, JP

Overview

58→
Patents
1979–2021
Patent span
Physics
Primary field (CPC G)

Patents· 58 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions25%
G05BControl or regulating systems in general13%
G03GElectrography10%
H04NPictorial communication, e.g. television6%
G06FElectric digital data processing5%
E02FDredging4%
Y02PClimate change mitigation technologies in the production or processing of goods4%
B65HHandling thin or filamentary material, e.g. sheets, webs, cables3%
H04LTransmission of digital information, e.g. telegraphic communication3%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
PatentTitleYear
10,884,327Light source apparatus and projection type display apparatus202110,859,365Method for controlling shape measuring apparatus202010,746,523Method for controlling shape measuring apparatus202010,724,840Control method of shape measuring apparatus202010,697,748Method for controlling shape measuring apparatus202010,550,545Work vehicle202010,385,546Work vehicle201910,379,520Method for controlling shape measuring apparatus201910,365,630Control method of profile measuring apparatus201910,293,752Display system for work vehicle, display control device, work vehicle, and display control method201910,274,297Method for controlling shape measuring apparatus201910,207,577Tractor20199,964,392Control method of profile measuring apparatus20189,915,516'Method for controlling shape measuring apparatus'20189,448,052'Shape measuring apparatus and control method of shape measuring apparatus'20169,366,522'Form measuring apparatus and form measurement method'20169,341,459'Form measuring apparatus and measuring method for V groove center'20169,335,143'Form measuring apparatus and method of registering coordinate system for rotary table'20169,298,178'Shape measuring apparatus'20169,213,497'Storage apparatus and storage apparatus migration method'20159,151,602'Corrected ball diameter calculating method and form measuring instrument'20159,103,648'Profile measuring method and profile measuring instrument'20158,910,473'Pipe layer and warm-up method for pipe layer'20148,630,576'Image forming system, post processing apparatus, sheet feed control method and sheet feed control program'20148,478,564'Shape measuring apparatus'20138,407,908'Profile measurement apparatus'20138,214,587'Storage apparatus and method for controlling storage apparatus'20127,958,564'Scanning measurement instrument'20117,643,963'Apparatus, method and program for measuring surface texture'20107,537,717'Method of manufacturing two-layer roll and method of manufacturing cylindrical member'20097,392,692'Surface scan measuring device, surface scan measuring method, surface scan measuring program and recording medium'20087,376,261'Surface scan measuring device and method of forming compensation table for scanning probe'20087,039,550'Surface scan measuring instrument, surface scan measuring method, surface scan measuring program and recording medium'20067,023,805'Communication connecting device capable of reliably transmitting data to an IP network and a data transmission control method'20067,012,920'Communication connecting device capable of reducing a load on an IP network and a data output control method'20066,977,945'Network interface apparatus for controlling the size, coupling or transfer rate of packets on the basis of an IP network delay and a method therefor'20056,975,420'Communication connecting device with a reliable transmission capability and a data output control method'20056,886,027'Communication apparatus with address translation for multimedia communication in different address spaces and multimedia communication method compatible with address translation'20056,772,953'Contactless data carrier'2004D0487430'Semiconductor memory element'20046,701,267'Method for calibrating probe and computer-readable medium'20046,701,268'Method for calibrating scanning probe and computer-readable medium therefor'20046,460,261'V-groove shape measuring method and apparatus by using rotary table'20026,142,470'Sorter with bin movement control system'20006,108,613'Probe coordinate system driving apparatus'20006,044,569'Measuring method and measuring instrument'20005,622,050'System for controlling a hydrostatic-mechanical transmission at the time of vehicle acceleration or deceleration'19975,557,391'Image forming apparatus for producing duplex or composite prints with improved efficiency by feeding sheets at shortened intervals'19965,543,907'Copying apparatus which can prohibit the sorting process'19965,329,345'Copying apparatus with automatic document handling device'19945,311,259'Image forming apparatus'19945,070,362'Image forming apparatus having a plurality of selectively operable developers'19915,053,814'Image forming apparatus'19914,949,124'Image forming apparatus having plural developing units and an arrangement for selecting the developing unit having the highest use count'19904,891,662'Image forming apparatus'19904,870,459'Copying machine'19894,543,929'Turbulence generating method and internal combustion engine for carrying out the same'19854,143,513'Heat insulator support in manifold reactor'1979

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1989–1996Patents assigned to MINOLTA CAMERA KK (9)· patent assignee history
1989–1997Based in Osaka, JP· patent location history
1997–2020Patents assigned to KOMATSU MFG CO LTD (6)· patent assignee history
2000–2020Patents assigned to MITUTOYO CORP (28)· patent assignee history
2000–2020Based in Tochigi, JP· patent location history
2000–2015Based in Utsunomiya, JP· patent location history
2005–2006Patents assigned to OKI ELECTRIC IND CO LTD (5)· patent assignee history
2005–2015Based in Tokyo, JP· patent location history
2012–2015Patents assigned to NODA TAKASHI (6)· patent assignee history
2013–2020Based in Shimotsuke, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MITUTOYO CORP282000–2020
MINOLTA CAMERA KK91989–1996
KOMATSU MFG CO LTD61997–2020
NODA TAKASHIself62012–2015
OKI ELECTRIC IND CO LTD52005–2006
Locations
LocationPatentsSpan
Tochigi, JP102000–2020
Utsunomiya, JP102000–2015
Shimotsuke, JP62013–2020
Tokyo, JP62005–2015
Osaka, JP61989–1997