Inventor

Chun-Kuang Chen

Inventor

Hsinchu County, TW

Overview

83→

Patents

2005–2020

Patent span

Electricity

Primary field (CPC H)

Patents· 83 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Lprimary

H01LSemiconductor devices20%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices17%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%

H10DInorganic electric semiconductor devices14%

H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1013%

H05BElectric heating6%

G06FElectric digital data processing2%

Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications2%

F21YIndexing scheme associated with subclasses f21k, f21l, f21s and f21v, relating to the form or the kind of the light sources or of the colour of the light emitted1%

F21KNon-electric light sources using luminescence1%

PatentTitleYear

10,880,981Collector pellicle2020 10,871,713Method of controlling reticle masking blade positioning to minimize impact on critical dimension uniformity and device for controlling reticle masking blade positioning2020 10,861,790Power strap structure for high performance and low current density2020 10,833,061Semiconductor device including source/drain contact having height below gate stack2020 10,818,509Method of fabricating semiconductor device with reduced trench distortions2020 10,784,168Dummy MOL removal for performance enhancement2020 10,763,113Lithographic technique for feature cut by line-end shrink2020 10,720,419Layout modification method for exposure manufacturing process2020 10,712,651Method and apparatus for collecting information used in image-error compensation2020 10,714,357Methods for improved critical dimension uniformity in a semiconductor device fabrication process2020 10,665,585Structure and method for alignment marks2020 10,642,158Method of controlling reticle masking blade positioning to minimize impact on critical dimension uniformity and device for controlling reticle masking blade positioning2020 10,510,688Via rail solution for high power electromigration2019 10,388,523Lithographic technique for feature cut by line-end shrink2019 10,366,973Layout modification method for exposure manufacturing process2019 10,345,718Pattern forming method and apparatus for lithography2019 10,312,109Lithographic technique incorporating varied pattern materials2019 10,276,377Method for patterning interconnects2019 10,276,499Dual power structure with connection pins2019 10,203,606Apparatus and method for dispensing developer onto semiconductor substrate2019 10,177,133Semiconductor device including source/drain contact having height below gate stack2019 10,170,422Power strap structure for high performance and low current density2019 10,169,515Layout modification method and system2019 10,163,738Structure and method for overlay marks2018 10,163,654Method of fabricating semiconductor device with reduced trench distortions2018 10,146,141Lithography process and system with enhanced overlay quality2018 10,114,291Grafting agent for forming spacer layer2018 10,096,522Dummy MOL removal for performance enhancement2018 10,032,639Methods for improved critical dimension uniformity in a semiconductor device fabrication process2018 10,007,177Method to define multiple layer patterns using double exposures2018 9,997,404Method of forming an interconnect structure for a semiconductor device2018 9,991,132Lithographic technique incorporating varied pattern materials2018 9,984,876Lithographic technique for feature cut by line-end shrink2018 9,911,697'Power strap structure for high performance and low current density'2018 9,814,111'Modular light control device and dimming control system'2017 9,793,211'Dual power structure with connection pins'2017 9,754,881'Designed-based interconnect structure in semiconductor structure'2017 9,728,407'Method of forming features with various dimensions'2017 9,684,236'Method of patterning a film layer'2017 9,613,850'Lithographic technique for feature cut by line-end shrink'2017 9,560,701'Driving circuit and lamps'2017 9,543,406'Structure and method for overlay marks'2017 9,538,594'Lamp'2017 9,530,660'Multiple directed self-assembly patterning process'2016 9,449,880'Fin patterning methods for increased process margin'2016 9,431,297'Method of forming an interconnect structure for a semiconductor device'2016 9,418,868'Method of fabricating semiconductor device with reduced trench distortions'2016 9,412,649'Method of fabricating semiconductor device'2016 9,383,657'Method and structure for lithography processes with focus monitoring and control'2016 9,323,155'Double patterning strategy for contact hole and trench in photolithography'2016 9,307,614'Color temperature and illumination adjusting system, and method thereof'2016 9,281,273'Designed-based interconnect structure in semiconductor structure'2016 9,214,347'Overlay mark assistant feature'2015 9,210,778'Integrated wireless and wired light control system'2015 9,148,751'Wireless control system and wireless network expansion method applied thereto'2015 9,107,255'Light-emitting diode light tube driving circuit'2015 9,055,625'Control method of lamp'2015 9,055,626'Dimmer circuit and lighting apparatus using the same'2015 9,000,525'Structure and method for alignment marks'2015 8,981,669'Lamps and control circuit'2015 8,884,527'Lamps'2014 8,847,505'Illumination control circuit and illumination control method'2014 8,758,963'Holographic reticle and patterning method'2014 8,741,552'Double patterning strategy for contact hole and trench in photolithography'2014 8,716,951'Illumination controlling circuit and illumination system'2014 8,563,198'Device and method for providing wavelength reduction with a photomask'2013 8,511,853'Point light source and light source module using the same'2013 8,513,821'Overlay mark assistant feature'2013 D0681863'Downlight'2013 8,227,150'Holographic reticle and patterning method'2012 8,173,548'Reverse planarization method'2012 8,027,529'System for improving critical dimension uniformity'2011 7,935,477'Double patterning strategy for contact hole and trench'2011 7,924,401'Seal ring arrangements for immersion lithography systems'2011 7,732,109'Method and system for improving critical dimension uniformity'2010 7,675,604'Hood for immersion lithography'2010 7,667,821'Multi-focus scanning with a tilted mask or wafer'2010 7,666,576'Exposure scan and step direction optimization'2010 7,517,639'Seal ring arrangements for immersion lithography systems'2009 7,180,572'Immersion optical projection system'2007 7,091,502'Apparatus and method for immersion lithography'2006 6,973,636'Method of defining forbidden pitches for a lithography exposure tool'2005 6,914,525'Alert system and method for geographic or natural disasters utilizing a telecommunications network'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005–2016Patents assigned to TAIWAN SEMICONDUCTOR MFG (21)· patent assignee history

2005–2017Based in Taipei, TW· patent location history

2005–2007Based in Taoyuang, TW· patent location history

2009–2018Based in Hsinchu, TW· patent location history

2010–2020Based in Hsinchu County, TW· patent location history

2012–2017Patents assigned to CHEN CHUN-KUANG (12)· patent assignee history

2013–2017Patents assigned to LEXTAR ELECTRONICS CORP (14)· patent assignee history

2013–2017Patents assigned to WANG HSIEN-CHENG (3)· patent assignee history

2016–2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (46)· patent assignee history

2016–2020Based in Guanxi Township, TW· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
TAIWAN SEMICONDUCTOR MFG CO LTD	46	2016–2020
TAIWAN SEMICONDUCTOR MFG	21	2005–2016
LEXTAR ELECTRONICS CORP	14	2013–2017
CHEN CHUN-KUANGself	12	2012–2017
WANG HSIEN-CHENG	3	2013–2017

Locations

Location	Patents	Span
Hsinchu County, TW	41	2010–2020
Guanxi Township, TW	14	2016–2020
Taipei, TW	13	2005–2017
Hsinchu, TW	11	2009–2018
Taoyuang, TW	2	2005–2007