Inventor
Osamu Takenaka
Inventor
Kariya, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1022%
Y10TTechnical subjects covered by former us classification22%
C23CCoating metallic material11%
H10DInorganic electric semiconductor devices11%
PatentTitleYear
6,736,003'Vehicle performance evaluation test method and apparatus'20046,681,620'Vehicle performance evaluation test method and apparatus'20045,876,861'Sputter-deposited nickel layer'19995,635,764'Surface treated structure for solder joint'19974,812,897'Semiconductor element sealing structure'19894,225,634'Method for manufacturing gas composition detector'1980Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1980–1999Patents assigned to NIPPON DENSO CO (4)· patent assignee history
1980Based in Chiryu, JP· patent location history
1989–2004Based in Kariya, JP· patent location history
2004Patents assigned to TOYOTA MOTOR CO LTD (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NIPPON DENSO CO | 4 | 1980–1999 |
| TOYOTA MOTOR CO LTD | 2 | 2004 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kariya, JP | 5 | 1989–2004 |
| Chiryu, JP | 1 | 1980 |