Inventor
Phuc Van
Inventor
San Jose, CA, US
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables50%
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
G01BMeasuring length, thickness or similar linear dimensions14%
LOC107%
PatentTitleYear
7,804,294'Non contact method and apparatus for measurement of sheet resistance of P-N junctions'20107,741,833'Non contact method and apparatus for measurement of sheet resistance of p-n junctions'20107,737,681'Non contact method and apparatus for measurement of sheet resistance of P-N junctions'20107,737,680'Non contact method and apparatus for measurement of sheet resistance of P-N junctions'20107,502,121'Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materials'20097,362,088'Non contact method and apparatus for measurement of sheet resistance of P-N junctions'20087,116,429'Determining thickness of slabs of materials by inventors'20067,019,513'Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions'20066,922,067'Determination of minority carrier diffusion length in solid state materials'20056,643,393'Method and apparatus for adhesion testing of thin film materials'20036,611,616'Method and apparatus for adhesion testing of thin film materials'20036,567,541'Method and apparatus for adhesion testing of thin film materials'20036,546,820'Method and apparatus for multifunction vacuum/nonvacuum annealing system'2003D0450000'Multiple environment testing chamber'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2003Patents assigned to KOO ANN F (2)· patent assignee history
2001–2010Based in San Jose, CA, US· patent location history
2003–2010Patents assigned to AHBEE 1 L P (6)· patent assignee history
2005Patents assigned to AHBEE 2 L P (1)· patent assignee history
2006Patents assigned to VAN PHUC (2)· patent assignee history
2010Patents assigned to ABHEE 1 L P (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AHBEE 1 L P | 6 | 2003–2010 |
| KOO ANN F | 2 | 2001–2003 |
| VAN PHUCself | 2 | 2006 |
| ABHEE 1 L P | 1 | 2010 |
| AHBEE 2 L P | 1 | 2005 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 14 | 2001–2010 |