Inventor

Koki Uwatoko

Inventor
Kanagawa, JP

Overview

25→
Patents
1998–2016
Patent span
Physics
Primary field (CPC G)

Patents· 25 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G03Gprimary
G03GElectrography18%
H04NPictorial communication, e.g. television18%
B41JTypewriters12%
B65HHandling thin or filamentary material, e.g. sheets, webs, cables9%
G06FElectric digital data processing9%
G01RMeasuring electric variables6%
G06KGraphical data reading6%
G06NComputing arrangements based on specific computational models6%
G06TImage data processing or generation, in general6%
G06VImage or video recognition or understanding6%
PatentTitleYear
9,298,150'Failure predictive system, and failure predictive apparatus'20168,977,142'Malfunction inferring apparatus, malfunction inferring method, and non-transitory computer readable medium'20158,712,257'Image forming system, prognosis criterion setting apparatus, prognosis apparatus, image forming apparatus and non-transitory computer-readable recording medium'20148,514,425'Image-forming system, criterion-setting apparatus, and storage medium'20138,403,448'Medium transport device, control program for medium transport device and control method for medium transport device'20138,405,870'Method and apparatus for detecting defects in an image forming apparatus'20138,400,693'Image defect diagnostic system, image forming apparatus, image defect diagnostic method and computer readable medium'20138,355,641'Paper wrinkle sign monitoring device, paper wrinkle sign monitoring method, and computer readable medium'20138,326,564'Detected data processing apparatus and computer readable medium for detecting data'20128,290,893'Failure diagnosis system, a failure diagnosis device, an information update device, and a computer-readable medium'20128,091,884'Transport device, overlap feed sign detection device, and computer readable medium'20127,903,844'Failure analysis system, failure analysis method, and program product for failure analysis'20117,676,703'Failure diagnosis system, image forming apparatus, computer readable medium and data signal'20107,489,881'Failure prevention diagnosis support system, failure prevention diagnosis support method, and program product of failure prevention diagnosis support'20097,403,870'Trouble sensing device'20087,324,909'Fault diagnosis apparatus'20087,275,009'Fault diagnosis apparatus'20077,250,781'Circuit board inspection device'20077,239,738'Image defect inspecting apparatus and image defect inspecting method'20077,174,264'Fault diagnosis apparatus'20077,076,086'Image inspection device'20067,003,258'Transfer device, transfer method and image forming device'20066,930,800'Halftone generation system and halftone generation method'20056,100,998'Print processor with efficient memory use'20005,777,669'Image reading device'1998

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1998–2016Patents assigned to FUJI XEROX CO LTD (25)· patent assignee history
1998–2016Based in Kanagawa, JP· patent location history
2000–2006Based in Nakai-machi, JP· patent location history
2005–2013Based in Ashigarakami-gun, JP· patent location history
2012–2014Patents assigned to UWATOKO KOKI (9)· patent assignee history
2012–2013Patents assigned to FURUKAWA SHIGEHIRO (7)· patent assignee history
2012–2013Patents assigned to ADACHI KOJI (6)· patent assignee history
2012–2013Patents assigned to YAMADA NORIKAZU (6)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJI XEROX CO LTD251998–2016
UWATOKO KOKIself92012–2014
FURUKAWA SHIGEHIRO72012–2013
ADACHI KOJI62012–2013
YAMADA NORIKAZU62012–2013
Locations
LocationPatentsSpan
Kanagawa, JP191998–2016
Ashigarakami-gun, JP42005–2013
Nakai-machi, JP22000–2006