Inventor
Hidekazu Nishizawa
Inventor
Kawasaki, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G09Gprimary
G09GArrangements or circuits for control of indicating devices using static means to present variable information40%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure20%
G01NInvestigating or analysing materials by determining their chemical or physical properties20%
G06FElectric digital data processing20%
PatentTitleYear
7,580,020'Semiconductor device and liquid crystal panel driver device'20097,555,648'Content management system, recording medium and method'20097,098,878'Semiconductor device and liquid crystal panel driver device'20065,010,299'Method for measuring stress on steel by determining the reverse magnetic permeability under a magnetic bias field'1991Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1991Patents assigned to NIKKOSHI CO LTD (1)· patent assignee history
1991Based in Osaka, JP· patent location history
2006Patents assigned to FUJITSU LTD (1)· patent assignee history
2006–2009Based in Kawasaki, JP· patent location history
2009Patents assigned to FUJITSU MICROELECTRONICS LTD (1)· patent assignee history
2009Patents assigned to TOSHIBA KK (1)· patent assignee history
2009Patents assigned to TOSHIBA SOLUTIONS CORP (1)· patent assignee history
2009Based in Machida, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FUJITSU LTD | 1 | 2006 |
| FUJITSU MICROELECTRONICS LTD | 1 | 2009 |
| NIKKOSHI CO LTD | 1 | 1991 |
| TOSHIBA KK | 1 | 2009 |
| TOSHIBA SOLUTIONS CORP | 1 | 2009 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kawasaki, JP | 2 | 2006–2009 |
| Machida, JP | 1 | 2009 |
| Osaka, JP | 1 | 1991 |