Inventor
Osamu Teranuma
Inventor
Tenri, JP
Overview
Patents· 30 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Fprimary
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation41%
H10DInorganic electric semiconductor devices13%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein9%
G09GArrangements or circuits for control of indicating devices using static means to present variable information7%
H04NPictorial communication, e.g. television6%
H05KPrinted circuits6%
H10KOrganic electric solid-state devices4%
B24CAbrasive or related blasting with particulate material2%
G01TMeasurement of nuclear or x-radiation2%
G02BOptical elements, systems or apparatus2%
PatentTitleYear
10,685,609Liquid crystal display device202010,002,573Field sequential display device and drive method therefor20189,058,784'Liquid crystal display device'20158,957,838'Liquid crystal display device and television receiver'20157,388,184'Image reading device and image reading method'20087,038,213'Composite active-matrix substrates, methods for manufacturing same, and electromagnetic wave capturing devices'20066,980,008'Uneven pattern detector and uneven pattern detecting method'20056,949,749'Electromagnetic imaging apparatus and manufacturing method therefor'20056,828,805'Uneven pattern sensing device'20046,798,030'Two-dimensional image detecting device and manufacturing method thereof'20046,781,109'Active matrix substrate having transparent connecting terminals'20046,759,660'Composite active-matrix substrates, methods for manufacturing same, and electromagnetic wave capturing devices'20046,667,481'Two-dimensional image sensor'20036,649,438'Manufacturing method for two-dimensional image detectors and two-dimensional image detectors'20036,638,782'Manufacturing method for two-dimensional image detectors and two-dimensional image detectors'20036,603,106'Two-dimensional image detector and fabrication method of the same'20036,562,659'External circuit packaging method and thermocompression bonding apparatus'20036,559,451'Manufacturing method for two-dimensional image detectors and two-dimensional image detectors'20036,518,557'Two-dimensional image detector, active-matrix substrate, and display device'20036,472,666'Two-dimensional image detector and fabrication method of the same'20026,398,624'Method of flattening a surface of a semiconductor film'20026,392,217'Two-dimensional image detecting device and manufacturing method thereof'20026,373,116'Two-dimensional image detector'20026,344,370'Method for fabricating detection element and method for fabricating two-dimensional image detector using detection element'20026,342,700'Two-dimensional image detector'20026,340,818'Two-dimensional image detector'20026,340,812'Two-dimensional image detector with electrodes on counter substrate'20026,262,408'Two-dimensional image detector and process for manufacturing the same'20016,242,746'Two-dimensional image detecting device and manufacturing method thereof'20016,242,729'Two-dimensional image detector'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2020Patents assigned to SHARP KK (30)· patent assignee history
2001–2004Patents assigned to SHIMADZU CORP (7)· patent assignee history
2001–2006Based in Tenri, JP· patent location history
2008Based in Nara, JP· patent location history
2015Patents assigned to TAKAHASHI MASAYUKI (2)· patent assignee history
2015Patents assigned to TERANUMA OSAMU (2)· patent assignee history
2015Patents assigned to INOUE AKIHIKO (1)· patent assignee history
2015–2018Based in Osaka, JP· patent location history
2020Based in Sakai, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SHARP KK | 30 | 2001–2020 |
| SHIMADZU CORP | 7 | 2001–2004 |
| TAKAHASHI MASAYUKI | 2 | 2015 |
| TERANUMA OSAMUself | 2 | 2015 |
| INOUE AKIHIKO | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tenri, JP | 25 | 2001–2006 |
| Osaka, JP | 3 | 2015–2018 |
| Sakai, JP | 1 | 2020 |
| Nara, JP | 1 | 2008 |